Journal of Applied Physics
Feedback | Help | Exit
Journal of Applied Physics
Search:
   
 
 
 
Previous Article
Temperature dependence of the domain wall depinning in magnetic hard-soft composites
We study the temperature and composition dependence of the depinning field Hd in magnetic hard-soft nanocomposite by finite temperature Monte Carlo simulation for a model of the composites. As the amo...
Next Article
Polymerized carbon nitride nanobells
Well-aligned carbon nitride nanotubes are fabricated by microwave plasma assisted chemical vapor deposition using iron as the catalyst. These nanotubes are linearly polymerized by carbon nitride nanob...

Evidence for a large enrichment of interstitial oxygen atoms in the nanometer-thick metal layer at the NbO/Nb (110) interface

J. Appl. Phys. 91, 9319 (2002); doi:10.1063/1.1473699

Issue Date: 1 June 2002

You are not logged in to this journal. Log in

I. Arfaoui
Commissariat à l'Energie Atomique, Service d'Etudes des Accelerateurs, Centre d'Etudes de Saclay, F-91191 Gif sur Yvette, France
Commissariat à l'Energie Atomique, Service de Physique et Chimie des Surfaces et Interfaces, Centre d'Etudes de Saclay, F-91191 Gif sur Yvette, France

C. Guillot and J. Cousty
Commissariat à l'Energie Atomique, Service de Physique et Chimie des Surfaces et Interfaces, Centre d'Etudes de Saclay, F-91191 Gif sur Yvette, France

C. Antoine
Commissariat à l'Energie Atomique, Service d'Etudes des Accelerateurs, Centre d'Etudes de Saclay, F-91191 Gif sur Yvette, France
The oxide/metal interface induced by surface segregation of oxygen during the annealing of a Nb single crystal in UHV has been studied by photoemission spectroscopy with synchrotron radiation. With 260 and 350 eV photons, four well-resolved peaks A, B, C, D are found in spectra within the 200–210 eV range of binding energy. One couple of peaks (A and C) is associated with 3d5/2 and 3d3/2 core levels of Nb atoms in the metal while the other one (B and D), shifted by 1.4 eV when compared to A and C, corresponds to 3d levels of oxidized Nb atoms. The metal peak A at 202.3 eV is formed by three 3d5/2 components: a peak due to a metallic state (202.1 eV) and two components shifted by 0.2 and 0.5 eV, which are attributed to Nb6O and Nb4O compounds due to interstitial atoms of oxygen, respectively. The estimated concentration of the interstitial oxygen atoms in the nanometer-thick metal skin underlying the NbO/Nb interface corresponds to a large enrichment when compared to the one in the Nb bulk. ©2002 American Institute of Physics.
History: Received 3 July 2001; accepted 5 March 2002
Permalink: http://link.aip.org/link/?JAPIAU/91/9319/1
BUY THIS ARTICLE   (US$24)
Download HTML Download Sectioned HTML Download PDF (192 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 68.35.Dv
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Solid surfaces and solid-solid interfaces: Structure and energetics Composition, segregation; defects and impurities
  • 68.35.Ct
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Solid surfaces and solid-solid interfaces: Structure and energetics Interface structure and roughness
  • 73.20.Hb
    Electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures Electron states at surfaces and interfaces Impurity and defect levels; energy states of adsorbed species
  • 79.60.Jv
    Electron and ion emission by liquids and solids; impact phenomena Photoemission and photoelectron spectra Interfaces; heterostructures; nanostructures
  • 61.72.Ji
    Structure of solids and liquids; crystallography Defects and impurities in crystals; microstructure Point defects (vacancies, interstitials, color centers, etc.) and defect clusters
  • 68.37.Xy
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Microscopy of surfaces, interfaces, and thin films Scanning Auger microscopy, photoelectron microscopy
  • 81.40.Gh
    Materials science Treatment of materials and its effects on microstructure and properties Other heat and thermomechanical treatments
  • YEAR: 2002

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (27)
View in Separate Window/Tab
For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. H. J. Goldschmidt, in Interstitial Alloys (Butterworths, London, 1967).
  2. K. K. Schulze, J. Met. 33, 33 (1981).
  3. Y. Adda and J. Philibert, in La Diffusion Dans Les Solides (PUF, Paris, 1966);
  4. B. M. Zykov, D. S. Ikonnoikov, and V. K. Tskhakaya, Sov. Phys. Solid State 17, 2322 (1976).
  5. R. Pantel, M. Bujor, and J. Bardolle, Surf. Sci. 62, 589 (1977).
  6. R. Franchy, T. U. Bartke, and P. Gassmann, Surf. Sci. 366, 60 (1996).
  7. A. Daccà, G. Gemme, L. Mattera, and R. Parodi, Appl. Surf. Sci. 126, 219 (1998).
  8. C. P. Flynn, W. Swieçh, R. S. Appleton, and M. Ondrejeck, Phys. Rev. B 62, 2096 (2000).
  9. Ch. Sürgers, M. Schöck, and H. von Löhneysen, Surf. Sci. 471, 209 (2001).
  10. O. Hellwig, Dissertation, University of Bochum, Germany, 2000.
  11. D. Spanjaard, C. Guillot, M. C. Desjonquieres, G. Treglia, and J. Lecante, Surf. Sci. Rep. 5, 1 (1985).
  12. C. Guillot, P. Roubin, J. Lecante, M. C. Desjonquieres, G. Treglia, D. Spanjaard, and Y. Jugnet, Phys. Rev. B 30, 5487 (1984).
  13. G. Treglia, M. C. Desjonquères, D. Spanjaard, Y. Lasailly, C. Guillot, Y. Jugnet, T. Minh Duc, and J. Lecante, Solid State Phys. 14, 3463 (1981).
  14. W. S. Lo, T.-S. Chien, C.-C. Tsan, and B.-S. Fang, Phys. Rev. B 51, 14749 (1995).
  15. F. Strisland, A. Ramstad, C. Berg, and S. Raaen, Philos. Mag. Lett. 78, 271 (1998).
  16. M. K. Bahl, J. Chem. Solids 36, 485 (1975).
  17. R. Fontaine, R. Caillat, L. Feve, and M. J. Guittet, J. Electron Spectrosc. Relat. Phenom. 10, 349 (1977).
  18. J. M. Sanz and S. Hofmann, J. Less-Common Met. 92, 317 (1983).
  19. F. A. Darlinski and J. Halbritter, Surf. Interface Anal. 10, 223 (1987).
  20. B. R. King, H. C. Patel, D. A. Gulino, and B. J. Tatarchuck, Thin Solid Films 192, 351 (1990).
  21. H. Safa, D. Moffat, B. Bonin, and F. Koechlin, J. Alloys Compd. 232, 281 (1996).
  22. I. Arfaoui, J. Cousty, and C. Guillot (unpublished).
  23. I. Arfaoui, J. Cousty, and H. Safa, Phys. Rev. B 65, 115413 (2002).
  24. (a) P. Kumar, J. Less-Common Met. 139, 149 (1988).
    25. (b) C. S. Barrett and T. B. Massalski, in Structure of metals (International Series on Materials Science and Technology) (Pergamon, Oxford, 1980).
  25. V. P. Kobyakov and V. N. Taranovskaya, Crystallogr. Rep. 44, 948 (1999).
  26. C. R. Brundle, Surf. Sci. 48, 99 (1975);
    27. R. E. Ballard, J. Electron Spectrosc. Relat. Phenom. 25, 75 (1982).
  27. H. Padamsee, J. Knobloch, and T. Hays, in RF Superconductivity for Accelerators (Wiley, New York, 1998).
  28. I. Kagan, A. J. Leggett, V. M. Agranovich, and A. A. Maradudin, in Quantum Tunnelling in Condensed Media (Modern Problems in Condensed Matter Sciences), edited by Yu. Kagan and A. J. Leggett (North-Holland, Amsterdam, 1992).

CITING ARTICLES
For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.


Copyright © American Institute of Physics