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Initial growth stages of epitaxial BaTiO3 films on vicinal SrTiO3 (001) substrate surfaces

J. Appl. Phys. 91, 10157 (2002); doi:10.1063/1.1478800

Issue Date: 15 June 2002

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A. Visinoiu, M. Alexe, H. N. Lee, D. N. Zakharov, A. Pignolet, D. Hesse, and U. Gösele
Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle, Germany
The initial growth mechanism of epitaxial BaTiO3 films is studied by combined application of atomic force microscopy, cross sectional high-resolution transmission electron microscopy, and x-ray diffraction. Epitaxial BaTiO3 thin films were grown by pulsed laser deposition on vicinal Nb-doped SrTiO3 (SrTiO3:Nb) (001) substrates with well-defined terraces. X-ray diffraction and cross sectional high-resolution transmission electron microscopy investigations revealed well-defined epitaxial films and a sharp interface between BaTiO3 films and SrTiO3:Nb substrates. The layer-then-island (Stranski–Krastanov mode) growth mechanism observed by analyzing the morphology of a sequence of films with increasing amount of deposited material has been confirmed by microstructure investigations. ©2002 American Institute of Physics.
History: Received 27 December 2001; accepted 23 March 2002
Permalink: http://link.aip.org/link/?JAPIAU/91/10157/1
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KEYWORDS and PACS

Keywords
PACS
  • 81.15.Fg
    Materials science Methods of deposition of films and coatings; film growth and epitaxy Laser deposition
  • 68.37.Ps
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Microscopy of surfaces, interfaces, and thin films Atomic force microscopy (AFM)
  • 68.37.Lp
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Microscopy of surfaces, interfaces, and thin films Transmission electron microscopy (TEM) (including STEM, HRTEM, etc.)
  • 68.55.Jk
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Thin film structure and morphology Structure and morphology; thickness; crystalline orientation and texture
  • YEAR: 2002

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PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
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