Electron energy deposition in an electron-beam pumped KrF amplifier: Impact of the gas composition
J. Appl. Phys. 92, 1200 (2002); doi:10.1063/1.1491592
Issue Date: 1 August 2002
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Calculations for electron deposition in electron beam generated KrF laser at atmospheric pressure have been performed. The impact of the Ar/Kr/F2 gas mixture on the electron energy distribution function, electron density, and mean energy, energy per electronion pair, attachment, dissociation, excitation, and ionization rates have been investigated. The F2 abundance controls the low energy (
9 eV) component of the distribution function, while both the fluorine and krypton mole fraction affect the distribution in the midenergy domain (9 to ~25 eV). Consequently, the F2 attachment rate coefficient varies with the F2 mole fraction (xF2) such that the electron density scales as 1/x
. The rate coefficient for direct dissociation of F2 is smaller than for attachment but the former contributes more to the total power dissipation (~8% at xF2 = 0.01). The excitation-to-ionization ratio for Kr is not constant, as generally assumed, but increases by a factor of two with a decrease in either the Kr or F2 abundance. Combining the former and present investigations leads to a set of fitting formulas to be used in beam kinetics codes for various collision rates as a function of both the electron beam power density and the composition. ©2002 American Institute of Physics.
9 eV) component of the distribution function, while both the fluorine and krypton mole fraction affect the distribution in the midenergy domain (9 to ~25 eV). Consequently, the F2 attachment rate coefficient varies with the F2 mole fraction (xF2) such that the electron density scales as 1/x| History: | Received 21 December 2001; accepted 15 May 2002 |
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KEYWORDS and PACS
krypton compounds,
electron beam pumping,
excimer lasers,
gas mixtures,
electron density,
electron impact ionisation,
electron impact dissociation,
laser theory
- 42.55.Lt
Optics Lasers Gas lasers including excimer and metal-vapor lasers - 42.60.By
Optics Laser optical systems: design and operation Design of specific laser systems - 42.55.Ah
Optics Lasers General laser theory - 34.80.Gs
Atomic and molecular collision processes and interactions Electron scattering Molecular excitation and ionization by electron impact - 34.80.Ht
Atomic and molecular collision processes and interactions Electron scattering Dissociation and dissociative attachment by electron impact - 42.60.Lh
Optics Laser optical systems: design and operation Efficiency, stability, gain, and other operational parameters - YEAR: 2002
RELATED DATABASES
PUBLICATION DATA
0021-8979 (print)
1089-7550 (online)
REFERENCES (22)
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- R. J. Jensen,
Fusion Technol. 11, 481 (1987) . - M. W. McGeoch, P. A. Corcoran, R. G. Altes, I. D. Smith, S. E. Bodner, R. H. Lehmberg, S. P. Obenschain, and J. D. Sethian,
Fusion Technol. 32, 610 (1997) . - J. D. Sethian, C. J. Pawley, S. P. Obenschain, K. A. Gerber, V. Serlin, C. A. Sullivan, T. Lehecka, W. D. Webster, M. W. McGeoch, I. D. Smith, P. A. Corcoran, and R. A. Altes,
IEEE Trans. Plasma Sci. 25, 221 (1997) . - J. D. Sethian, S. P. Obenschain, K. A. Gerber, C. J. Pawley, V. Serlin, C. A. Sullivan, W. D. Webster, A. V. Deniz, T. Lehecka, M. W. McGeoch, R. A. Altes, P. A. Corcoran, I. D. Smith, and O. C. Barr, Rev. Sci. Instrum. 68, 2357 (1997).
- J. D. Sethian, M. Meyers, I. D. Smith, V. Carboni, J. Kishi, D. Morton, J. Pearce, B. Bowen, L. Schlitt, O. Barr, and W. Webster,
IEEE Trans. Plasma Sci. 28, 1333 (2000) . - I. Okuda, J. Ma, E. Takahashi, I. Matsushima, Y. Matsumoto, S. Kato, and Y. Owadano,
Appl. Phys. B: Lasers Opt. 72, 623 (2001) . - I. Okuda, E. Takahashi, I. Matsushima, Y. Matsumoto, S. Kato, and Y. Owadano,
Jpn. J. Appl. Phys., Part 1 40, 1152 (2001) . - G. M. Petrov, J. L. Giuliani, and A. Dasgupta, J. Appl. Phys. 91, 2662 (2002).
- L. R. Peterson and J. E. Allen, J. Chem. Phys. 56, 6068 (1972).
- T. H. Johnson and A. M. Hunter, J. Appl. Phys. 51, 2406 (1980).
- W. L. Morgan and A. Szöke, Phys. Rev. A 23, 1256 (1981).
- A. Mandl, D. Klimek, and J. H. Parks, J. Appl. Phys. 55, 3940 (1984).
- F. Kannari, M. Obara, and T. Fujioka, J. Appl. Phys. 57, 4309 (1985).
- S. J. Czuchlewski, D. E. Hanson, B. J. Krohn, and A. R. Larson,
Fusion Technol. 11, 560 (1987) . - W. L. Nighan, Appl. Phys. Lett. 32, 297 (1978).
- A. Suda, H. Kumagai, and M. Obara, Appl. Phys. Lett. 51, 218 (1987).
- W. L. Morgan,
Plasma Chem. Plasma Process. 12, 449 (1992) . - D. L. McCorkle, L. G. Christophorou, A. A. Christodoulides, and L. Pichiarella, J. Chem. Phys. 85, 1966 (1986).
- M. J. Kushner and T. J. Moratz, Appl. Phys. Lett. 52, 1856 (1988).
- M. Hayashi and T. Nimura, J. Appl. Phys. 54, 4879 (1983).
- M. Elyaakoubi and P. Ranson, J. Appl. Phys. 78, 4733 (1995).
- L. G. Christophorou, Atomic and Molecular Radiation Physics (Wiley, London, 1971), p. 35.







