Interface reactions and Kirkendall voids in metal organic vapor-phase epitaxy grown Cu(In,Ga)Se2 thin films on GaAs
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Cu(In1−xGax)Se2 (CIGS) films were grown on (001) GaAs at 570 or 500 °C by means of metal organic vapor-phase epitaxy. All films were Cu-rich [Cu/(In+Ga)>1] with pseudomorphic Cu2S...
Virtual structure in luminescence profile of zinc oxide films causing discrepancy in peak identification
The luminescence properties of zinc oxide (ZnO) films prepared by pulsed laser deposition were investigated by photoluminescence spectroscopy. Films of different thicknesses were deposited on silicon,...
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Resonant frequencies of a rectangular cantilever beam immersed in a fluid
J. Appl. Phys. 100, 114916 (2006); doi:10.1063/1.2401053
Published 14 December 2006
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The resonant frequencies of cantilever beams can depend strongly on the fluid in which they are immersed. In this article, we expand on the method of Elmer and Dreier [J. Appl. Phys. 81, 7709 (1997)] and derive explicit analytical formulas for the flexural and torsional resonant frequencies of a rectangular cantilever beam immersed in an inviscid fluid. These results are directly applicable to cantilever beams of macroscopic size, where the effects of viscosity are negligible, and are valid for arbitrary mode number. In contrast to low mode numbers, in all cases it is found that the fluid has no effect on the resonant frequencies in the limit of infinite mode number.
©2006 American Institute of Physics
| History: | Received 5 May 2006; accepted 6 October 2006; published 14 December 2006 |
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