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Thin-film evolution equation for a strained solid film on a deformable substrate: Numerical steady states

J. Appl. Phys. 102, 073503 (2007); doi:10.1063/1.2785024

Published 1 October 2007

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W. T. Tekalign
School of Mathematical Sciences, Rochester Institute of Technology, 85 Lomb Memorial Drive, Rochester, New York 14623, USA

B. J. Spencer
Department of Mathematics, University at Buffalo, Buffalo, New York 14260, USA
We consider the nonlinear behavior of the thin-film evolution equation for a strained solid film on a substrate. The evolution equation describes morphological changes to the film by surface diffusion in response to elastic energy, surface energy, and wetting energy. Due to the thin-film approximation, the elastic response of the film is determined analytically, resulting in a self-contained evolution equation which does not require separate numerical solution of the full three-dimensional elasticity problem. Using a pseudospectral predictor-corrector method we numerically determine the family of steady state solutions to this evolution equation which correspond to quantum dot and quantum ridge morphologies. ©2007 American Institute of Physics
History: Received 15 May 2007; accepted 6 August 2007; published 1 October 2007
Permalink: http://link.aip.org/link/?JAPIAU/102/073503/1
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KEYWORDS and PACS

Keywords
PACS
  • 68.55.Jk
    Thin film structure and morphology; thickness; crystalline orientation and texture
  • 68.35.Fx
    Diffusion; interface formation (solid surfaces)
  • 68.35.Md
    Surface thermodynamics and surface energies of solids
  • 68.60.Bs
    Mechanical and acoustical properties of thin films
  • YEAR: 2007

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PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
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REFERENCES (30)
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