Journal of Applied Physics
Feedback | Help | Exit
Journal of Applied Physics
   
 
 
 
Previous Article
Characterization of hot wall grown silver phthalocyanine films
Silver phthalocyanine (AgPc) has attracted considerable interest because of its outstanding chemical stability, optical and electrical properties, and wide variety of potential applications in modern ...
Next Article
Tensile strength and fracture toughness of brittle materials
The fracture properties of brittle materials under tension have been explained by many authors; however, questions such as the dependence of the tensile strength on the crack tip radius of curvature a...

Thin-film evolution equation for a strained solid film on a deformable substrate: Numerical steady states

J. Appl. Phys. 102, 073503 (2007); doi:10.1063/1.2785024

Published 1 October 2007

You are not logged in to this journal. Log in

W. T. Tekalign
School of Mathematical Sciences, Rochester Institute of Technology, 85 Lomb Memorial Drive, Rochester, New York 14623, USA

B. J. Spencer
Department of Mathematics, University at Buffalo, Buffalo, New York 14260, USA
We consider the nonlinear behavior of the thin-film evolution equation for a strained solid film on a substrate. The evolution equation describes morphological changes to the film by surface diffusion in response to elastic energy, surface energy, and wetting energy. Due to the thin-film approximation, the elastic response of the film is determined analytically, resulting in a self-contained evolution equation which does not require separate numerical solution of the full three-dimensional elasticity problem. Using a pseudospectral predictor-corrector method we numerically determine the family of steady state solutions to this evolution equation which correspond to quantum dot and quantum ridge morphologies. ©2007 American Institute of Physics
History: Received 15 May 2007; accepted 6 August 2007; published 1 October 2007
Permalink: http://link.aip.org/link/?JAPIAU/102/073503/1
BUY THIS ARTICLE   (US$28)
Download HTML Download Sectioned HTML Download PDF (725 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 68.55.Jk
    Thin film structure and morphology; thickness; crystalline orientation and texture
  • 68.35.Fx
    Diffusion; interface formation (solid surfaces)
  • 68.35.Md
    Surface thermodynamics and surface energies of solids
  • 68.60.Bs
    Mechanical and acoustical properties of thin films
  • YEAR: 2007

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (30)
View in Separate Window/Tab
For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. M. A. Kastner, in Proceedings of the 23rd International Conference on Physics of Semiconductors, Berlin, Germany, 1996, edited by M. Scheffler and R. Zimmerman (World Scientific, Singapore), Vol. 1, p. 27.
  2. M. Chen and W. Porod, J. Appl. Phys. 78, 1050 (1995).
  3. R. J. Asaro and W. A. Tiller, Metall. Trans. 3, 1789 (1972).
  4. M. A. Grinfeld, Dokl. Akad. Nauk SSSR 31, 831 (1986)
    5. [Sov. Phys. Dokl. 31, 831 (1986)].
  5. D. J. Srolovitz, Acta Metall. 37, 621 (1989).
  6. B. J. Spencer, P. W. Voorhees, and S. H. Davis, Phys. Rev. Lett. 67, 3696 (1991).
  7. I. Daruka, J. Tersoff, and A. L. Barbasi, Phys. Rev. Lett. 82, 2753 (1999).
  8. W. D. Nix, Metall. Trans. A 20A, 2217 (1989).
  9. H. Gao, J. Mech. Phys. Solids 39, 443 (1991).
  10. H. Gao, Int. J. Solids Struct. 28, 703 (1991).
  11. M. A. Grinfeld, J. Nonlinear Sci. 3, 35 (1993).
  12. J. Berrehar, C. Caroli, C. Lapersonne-Meyer, and M. Schott, Phys. Rev. B 46, 13487 (1992).
  13. D. E. Jesson, S. J. Pennycook, J. M. Baribeau, and D. C. Houghton, Phys. Rev. Lett. 71, 1744 (1993).
  14. W. H. Yang and D. J. Srolovitz, J. Mech. Phys. Solids 42, 1551 (1994).
  15. B. J. Spencer and D. I. Meiron, Acta Metall. Mater. 37, 621 (1994).
  16. Y. Xiang and E. Weinan, J. Appl. Phys. 91, 9414 (2002).
  17. B. J. Spencer and J. Tersoff, Mater. Res. Soc. Symp. Proc. 399, 283 (1996).
  18. B. J. Spencer and J. Tersoff, Phys. Rev. Lett. 79, 4858 (1997).
  19. R. V. Kukta and L. B. Freund, J. Mech. Phys. Solids 45, 1835 (1997).
  20. B. J. Spencer, Phys. Rev. B 59, 2011 (1999).
  21. C. D. Rudin and B. J. Spencer, J. Appl. Phys. 86, 5530 (1999).
  22. L. L. Shanahan and B. J. Spencer, Interfaces Free Boundaries 4, 1 (2002).
  23. Y. W. Zhang and A. F. Bower, J. Mech. Phys. Solids 47, 2273 (1999).
  24. P. Liu, Y. W. Zhang, and C. Lu, Phys. Rev. B 68, 035402 (2003).
  25. A. A. Golovin, S. H. Davis, and P. W. Voorhees, Phys. Rev. E 68, 056203 (2003).
  26. W. T. Tekalign and B. J. Spencer, J. Appl. Phys. 96, 5505 (2004).
  27. W. W. Mullins, J. Appl. Phys. 28, 333 (1957).
  28. W. T. Tekalign, Ph.D. thesis, University at Buffalo, 2005.
  29. Y. Pang and R. Huang, Phys. Rev. B 74, 075413 (2006).
  30. M. S. Levine, A. A. Golovin, S. H. Davis, and P. W. Voorhees, Phys. Rev. B 75, 205312 (2007).

CITING ARTICLES
For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.


Copyright © American Institute of Physics