Influence of atomic force microscope cantilever tilt and induced torque on force measurements
J. Appl. Phys. 103, 064513 (2008); doi:10.1063/1.2885734
Published 25 March 2008
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Quantitative force measurements performed using the atomic force microscope (AFM) inherently rely on calibration of the AFM cantilever spring constant to convert the measured deflection into a force. Here, we examine the effect of cantilever tilt and induced torque on the effective normal spring constant resulting from variable placement of the tip probe, as is frequently encountered in practice. Explicit general formulas are presented that account for these combined effects for both sharp tips and spherical probes. In contrast to previous studies, we find that induced tip torque can act to either enhance or reduce the effective normal spring constant of the cantilever. The implications of this study to practical force measurements are discussed.
©2008 American Institute of Physics
| History: | Received 10 October 2007; accepted 24 December 2007; published 25 March 2008 |
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http://link.aip.org/link/?JAPIAU/103/064513/1 |
REFERENCES (15)
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- G. Binnig and C. F. Quate, Phys. Rev. Lett. 56, 930 (1986).
- B. Cappella and G. Dietler,
Surf. Sci. Rep. 34, 1 (1999) . - G. Meyer and N. M. Amer, Appl. Phys. Lett. 53, 2400 (1988).
- J. E. Sader, I. Larson, P. Mulvaney, and L. R. White, Rev. Sci. Instrum. 66, 3789 (1995).
- P. Attard, A. Carambassis, and M. W. Rutland,
Langmuir 15, 553 (1999) . - O. Heim, M. Kappl, and H. J. Butt,
Langmuir 20, 2760 (2004) . - J. L. Hutter,
Langmuir 21, 2630 (2005) . - W. A. Ducker, T. J. Senden, and R. M. Pashley,
Nature (London) 353, 239 (1991) . - W. A. Ducker, T. J. Senden, and R. M. Pashley,
Langmuir 8, 1831 (1992) . - J. E. Sader, in Encyclopedia of Colloid and Surface Sciences, edited by A. Hubbard (Marcel Dekker, New York, 2002), p. 846.
- J. M. Neumeister and W. A. Ducker, Rev. Sci. Instrum. 65, 2527 (1994).
- J. E. Sader, Rev. Sci. Instrum. 74, 2438 (2003).
- The displacement
zc and angle 
are specified at the same point on the cantilever, and as such, the analysis implicitly assumes the laser spot is positioned at or beyond the point of tip attachment. The optical lever calibration depends on the position and size of the laser spot.14 The effect of this uncertainty is expected to be small when the spot is (i) much smaller than the length of the cantilever, and (ii) positioned near the free end of the cantilever. - R. Proksch, T. E. Schaeffer, J. P. Clelevand, R. C. Callahan, and M. Viani,
Nanotechnology 15, 1344 (2004) . - J. Stiernstedt, M. W. Rutland, and P. Attard, Rev. Sci. Instrum. 76, 083710 (2005).







