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Influence of atomic force microscope cantilever tilt and induced torque on force measurements

J. Appl. Phys. 103, 064513 (2008); doi:10.1063/1.2885734

Published 25 March 2008

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Scott A. Edwards,1 William A. Ducker,2 and John E. Sader3
1Department of Mathematics and Statistics, The University of Melbourne, Victoria 3010, Australia
2Department of Chemical and Biomolecular Engineering, The University of Melbourne, Victoria 3010, Australia
3Department of Mathematics and Statistics, The University of Melbourne, Victoria 3010, Australia

Quantitative force measurements performed using the atomic force microscope (AFM) inherently rely on calibration of the AFM cantilever spring constant to convert the measured deflection into a force. Here, we examine the effect of cantilever tilt and induced torque on the effective normal spring constant resulting from variable placement of the tip probe, as is frequently encountered in practice. Explicit general formulas are presented that account for these combined effects for both sharp tips and spherical probes. In contrast to previous studies, we find that induced tip torque can act to either enhance or reduce the effective normal spring constant of the cantilever. The implications of this study to practical force measurements are discussed. ©2008 American Institute of Physics
History: Received 10 October 2007; accepted 24 December 2007; published 25 March 2008
Permalink: http://link.aip.org/link/?JAPIAU/103/064513/1
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KEYWORDS and PACS

Keywords
PACS
  • 07.79.Lh
    Atomic force microscopes
  • 07.10.Pz
    Instruments for strain, force, and torque
  • YEAR: 2008

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PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
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REFERENCES (15)

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