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Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching

J. Appl. Phys. 105, 053711 (2009); doi:10.1063/1.3079797

Published 11 March 2009

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Richard R. Lunt,1,2 Noel C. Giebink,1,2 Anna A. Belak,2 Jay B. Benziger,1 and Stephen R. Forrest2
1Department of Chemical Engineering, Princeton Institute for the Science and Technology of Materials (PRISM), Princeton University, Princeton, New Jersey 08544, USA
2Departments of Electrical Engineering & Computer Science, Physics, and Materials Science & Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA
We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by Förster transfer, whereas triplet diffusion occurs primarily via Dexter transfer. ©2009 American Institute of Physics
History: Received 27 November 2008; accepted 7 January 2009; published 11 March 2009
Permalink: http://link.aip.org/link/?JAPIAU/105/053711/1
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KEYWORDS and PACS

Keywords
PACS
  • 71.35.-y
    Excitons and related phenomena
  • 78.66.Qn
    Optical properties of polymers; organic compounds (thin films)
  • 78.55.Kz
    Photoluminescence in solid organic materials
  • 81.05.Hd
    Other semiconductors: fabrication, treatment, testing and analysis
  • 68.55.J-
    Thin film morphology
  • YEAR: 2009

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (46)
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