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Scanning Hall probe microscopy of a diluted magnetic semiconductor

J. Appl. Phys. 105, 093906 (2009); doi:10.1063/1.3122145

Published 5 May 2009

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Seongsoo Kweon,1 Nitin Samarth,2 and Alex de Lozanne1,3
1Materials Science and Engineering, University of Texas at Austin, Austin, Texas 78712, USA
2Physics Department, Penn State University, University Park, Pennsylvania 16802, USA
3Department of Physics, University of Texas at Austin, Austin, Texas 78712, USA

We have measured the micromagnetic properties of a diluted magnetic semiconductor as a function of temperature and applied field with a scanning Hall probe microscope built in our laboratory. The design philosophy for this microscope and some details are described. The samples analyzed in this work are Ga0.94Mn0.06As films grown by molecular beam epitaxy. We find that the magnetic domains are 2–4  µm wide and fairly stable with temperature. Magnetic clusters are observed above TC, which we ascribe to MnAs defects too small and sparse to be detected by a superconducting quantum interference device magnetometer. ©2009 American Institute of Physics
History: Received 28 January 2009; accepted 23 March 2009; published 5 May 2009
Permalink: http://link.aip.org/link/?JAPIAU/105/093906/1
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KEYWORDS and PACS

Keywords
PACS
  • 75.70.Ak
    Magnetic properties of monolayers and thin films
  • 75.50.Pp
    Magnetic semiconductors
  • 81.15.Hi
    Molecular, atomic, ion, and chemical beam epitaxy
  • 75.70.Kw
    Domain structure in magnetic films (magnetic bubbles)
  • YEAR: 2009

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PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
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REFERENCES (33)

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  1. T. Jungwirth, J. Sinova, J. Masek, J. Kucera, and A. H. MacDonald, Rev. Mod. Phys. 78, 809 (2006).
  2. A. Van Esch, L. Van Bockstal, J. De Boeck, G. Verbanck, A. S. van Steenbergen, P. J. Wellmann, B. Grietens, R. Bogaerts, F. Herlach, and G. Borghs, Phys. Rev. B 56, 13103 (1997).
  3. C. Gould, S. Mark, K. Pappert, G. Dengel, J. Wenisch, R. P. Campion, A. W. Rushforth, D. Chiba, Z. Li, X. Liu, W. Van Roy, H. Ohno, J. K. Furdyna, B. Gallagher, K. Brunner, G. Schmidt, and L. W. Molenkamp, New J. Phys. 10, 055007 (2008).
  4. S. J. Bending, Adv. Phys. 48, 449 (1999).
  5. A. L. de Lozanne, S. A. Elrod, and C. F. Quate, Phys. Rev. Lett. 54, 2433 (1985).
  6. H. L. Edwards, J. T. Markert, and A. L. de Lozanne, Phys. Rev. Lett. 69, 2967 (1992).
  7. C. W. Yuan, E. Batalla, A. deLozanne, M. Kirk, and M. Tortonese, Appl. Phys. Lett. 65, 1308 (1994).
  8. C. Israel, C. Hyun, A. de Lozanne, S. Phark, and Z. G. Khim, Rev. Sci. Instrum. 77, 023704 (2006).
  9. T. -M. Chuang and A. de Lozanne, Rev. Sci. Instrum. 78, 053710 (2007).
  10. A. M. Chang, H. D. Hallen, L. Harriott, H. F. Hess, H. L. Kao, J. Kwo, R. E. Miller, R. Wolfe, J. van der Ziel, and T. Y. Chang, Appl. Phys. Lett. 61, 1974 (1992).
  11. A. Oral, S. J. Bending, and M. Henini, Appl. Phys. Lett. 69, 1324 (1996).
  12. Nanomagnetics Instruments Ltd., http://web.nanomagnetics-inst.com.
  13. A. J. Brook, S. J. Bending, J. Pinto, A. Oral, D. Ritchie, H. Beere, M. Henini, and A. Springthorpe, Appl. Phys. Lett. 82, 03538 (2003).
  14. D. Gregušová, V. Cambel, J. Fedor, R. Kúdela, J. Šoltýs, T. Lalinský, I. Kostič, and S. J. Bending, Appl. Phys. Lett. 82, 3704 (2003).
  15. C. W. Hicks, L. Luan, K. A. Moler, E. Zeldov, and H. Shtrikman, Appl. Phys. Lett. 90, 133512 (2007).
  16. A. Sandhu, K. Kurosawa, M. Dede, and A. Oral, Jpn. J. Appl. Phys., Part 1 43, 777 (2004).
  17. M. Dede, K. Ürkmen, Ö. Girisen, M. Atabak, A. Oral, I. Farrer, and D. Ritchie, J. Nanosci. Nanotechnol. 8, 619 (2008).
  18. R. B. Dinner, M. R. Beasley, and K. A. Moler, Rev. Sci. Instrum. 76, 103702 (2005).
  19. A. Oral, J. C. Barnard, S. J. Bending, I. I. Kaya, S. Ooi, T. Tamegai, and M. Henini, Phys. Rev. Lett. 80, 3610 (1998).
  20. A. N. Grigorenko, S. J. Bending, J. K. Gregory, and R. G. Humphreys, Appl. Phys. Lett. 78, 1586 (2001).
  21. A. Sandhu, A. Okamoto, I. Shibasaki, and A. Oral, Microelectron. Eng. 73-74, 524 (2004).
  22. R. C. Richardson and E. N. Smith, Experimental Techniques in Condensed Matter Physics at Low Temperatures (Addison-Wesley, Reading, MA, 1988), pp. 108–109.
  23. S. H. Pan, International Patent Publication No. WO93/19494 (30 September 1993)
  24. The design is also described in S. H. Pan, E. W. Hudson, and J. C. Davis, Rev. Sci. Instrum. 70, 1459 (1999).
  25. Physik Instrumente GmbH, http://www.physikinstrumente.com.
  26. J. Tapson and J. F. L. Greene, Rev. Sci. Instrum. 64, 2387 (1993).
  27. C. Dubois, P. E. Bisson, A. A. Manuel, Ø. Fischer, and S. Reymond, Rev. Sci. Instrum. 77, 043712 (2006).
  28. C. Meyer, O. Sqalli, H. Lorenz, and K. Karrai, Rev. Sci. Instrum. 76, 063706 (2005).
  29. W. F. Smith, M. C. Abraham, J. M. Sloan, and M. Switkes, Rev. Sci. Instrum. 67, 3599 (1996).
  30. O. Maksimov, B. L. Sheu, G. Xiang, N. Keim, P. Schiffer, and N. Samarth, J. Cryst. Growth 269, 298 (2004).
  31. T. Dietl, H. Ohno, F. Matsukura, J. Cibert, and D. Ferrand, Science 287, 1019 (2000).
  32. A. Pross, S. Bending, K. Edmonds, R. P. Campion, C. T. Foxon, and B. Gallagher, J. Appl. Phys. 95, 3225 (2004).
  33. A. Pross, S. J. Bending, K. Y. Wang, K. W. Edmonds, R. P. Campion, C. T. Foxon, B. L. Gallagher, and M. Sawicki, J. Appl. Phys. 99, 093908 (2006).
  34. T. Shono, T. Hasegawa, T. Fukumura, F. Matsukura, and H. Ohno, Appl. Phys. Lett. 77, 1363 (2000).

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