Scanning Hall probe microscopy of a diluted magnetic semiconductor
J. Appl. Phys. 105, 093906 (2009); doi:10.1063/1.3122145
Published 5 May 2009
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We have measured the micromagnetic properties of a diluted magnetic semiconductor as a function of temperature and applied field with a scanning Hall probe microscope built in our laboratory. The design philosophy for this microscope and some details are described. The samples analyzed in this work are Ga0.94Mn0.06As films grown by molecular beam epitaxy. We find that the magnetic domains are 2–4 µm wide and fairly stable with temperature. Magnetic clusters are observed above TC, which we ascribe to MnAs defects too small and sparse to be detected by a superconducting quantum interference device magnetometer.
©2009 American Institute of Physics
| History: | Received 28 January 2009; accepted 23 March 2009; published 5 May 2009 |
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http://link.aip.org/link/?JAPIAU/105/093906/1 |
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0021-8979 (print)
1089-7550 (online)
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