Journal of Applied Physics
Search:
   
 
 
 
Previous Article
Formation and material analysis of plasma polymerized carbon nitride nanoparticles
This paper deals with the analysis of nanoparticles polymerized in nitrogen/acetylene and argon/acetylene gas mixtures in low temperature rf discharges. The polymerization process was monitored by mea...
Next Article
Ultradirective antenna via transformation optics
Spatial coordinate transformation is used as a reliable tool to control electromagnetic fields. In this paper, we derive the permeability and permittivity tensors of a metamaterial able to transform a...

On the capacitance-boost of ionic polymer metal composites due to electroless plating: Theory and experiments

J. Appl. Phys. 105, 104911 (2009); doi:10.1063/1.3129503

Published 27 May 2009

You are not logged in to this journal. Log in

Matteo Aureli, Weiyang Lin, and Maurizio Porfiri
Department of Mechanical and Aerospace Engineering, Polytechnic Institute of New York University, Brooklyn, New York 11201, USA
In this paper, we analyze the effect of electrode surface roughness on ionic polymer metal composite (IPMC) capacitance. We use the linearized Poisson–Nernst–Planck model to describe the charge and electric potential distribution in response to a small voltage applied across the IPMC electrodes. We use perturbation methods to develop a comprehensive understanding of the interplay among the scale of the electrode roughness, the Debye screening length, and the IPMC nominal dimensions on the electrical behavior of IPMCs. We derive a closed-form expression of the IPMC capacitance per unit nominal surface area in terms of the Debye screening length, the IPMC nominal thickness, and physically relevant statistical properties of the rough landscape. We find that IPMC capacitance is largely dictated by the effective electrode surface area when the Debye screening length is considerably smaller than the polymer thickness. In this case, the diffuse charge layers that form at the polymer-electrode interface closely follow the rough electrodes profile. As the Debye screening length increases, diffuse layers do not completely adhere to the electrode profile, and local curvature changes and additional geometric factors contribute to the overall IPMC capacitance. We specialize our findings to different electrode models, including fractal electrodes that have been recently observed in IPMC morphological studies. We corroborate our theoretical findings with experimental data on the capacitance of in-house fabricated IPMCs. ©2009 American Institute of Physics
History: Received 20 December 2008; accepted 7 April 2009; published 27 May 2009
Permalink: http://link.aip.org/link/?JAPIAU/105/104911/1
BUY THIS ARTICLE   (US$24)
Download HTML Download Sectioned HTML Download PDF (354 kB) View Cart

KEYWORDS and PACS

Keywords
PACS

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (72)

For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. C. Bonomo, L. Fortuna, P. Giannone, S. Graziani, and S. Strazzeri, Smart Mater. Struct. 17, 015014 (2008).
  2. C. Bonomo, P. Brunetto, L. Fortuna, P. Giannone, S. Graziani, and S. Strazzeri, IEEE Sens. J. 8, 1486 (2008).
  3. J. Brufau-Penella, M. Puig-Vidal, P. Giannone, S. Graziani, and S. Strazzeri, Smart Mater. Struct. 17, 015009 (2008).
  4. S. Guo, T. Fukuda, and K. Asaka, IEEE/ASME Trans. Mechatron. 8, 136 (2003).
  5. E. Mbemmo, Z. Chen, S. Shatara, and X. Tan, Proceedings of the 2008 IEEE International Conference on Robotics and Automation, Pasadena, CA, 19–23 May 2008, pp. 689–694.
  6. T. T. Nguyen, N. S. Goo, V. K. Nguyen, Y. Yoo, and S. Park, Sens. Actuators A 141, 640 (2008).
  7. M. Shahinpoor, Y. Bar-Cohen, J. O. Simpson, and J. Smith, Smart Mater. Struct. 7, R15 (1998).
  8. M. Shahinpoor and K. J. Kim, Smart Mater. Struct. 13, 1362 (2004).
  9. G. Del Bufalo, L. Placidi, and M. Porfiri, Smart Mater. Struct. 17, 045010 (2008).
  10. K. Oguro, Preparation Procedure Ion-Exchange Polymer Metal Composites (IPMC) Membranes, Osaka National Research Institute, AIST, Japan (http://ndeaa.jpl.nasa.gov/nasa-nde/lommas/eap/IPMC_PrepProcedure.htm).
  11. K. Onishi, S. Sewa, K. Asaka, N. Fujiwara, and K. Oguro, Electrochim. Acta 46, 1233 (2001).
  12. S. J. Kim, S. -M. Kim, K. J. Kim, and Y. H. Kim, Smart Mater. Struct. 16, 2286 (2007).
  13. S. Nemat-Nasser, J. Appl. Phys. 92, 2899 (2002).
  14. S. Nemat-Nasser, S. Zamani, and Y. Tor, J. Appl. Phys. 99, 104902 (2006).
  15. M. Shahinpoor, Electrochim. Acta 48, 2343 (2003).
  16. B. J. Akle, T. Wallmersperger, E. Akle, and D. J. Leo, Proc. SPIE 6929, 69290N (2008).
  17. C. Bonomo, L. Fortuna, P. Giannone, and S. Graziani, IEEE Trans. Circuits Syst., I: Regul. Pap. 53, 338 (2006).
  18. P. J. Costa Branco and J. A. Dente, Smart Mater. Struct. 15, 378 (2006).
  19. J. Paquette, K. Kim, J. -D. Nam, and Y. Tak, J. Intell. Mater. Syst. Struct. 14, 633 (2003).
  20. M. Porfiri, J. Appl. Phys. 104, 104915 (2008).
  21. Z. Chen and X. Tan, IEEE/ASME Trans. Mechatron. 13, 519 (2008).
  22. B. J. Akle, D. J. Leo, M. A. Hickner, and J. E. McGrath, J. Mater. Sci. 40, 3715 (2005).
  23. K. Farinholt and D. J. Leo, Mech. Mater. 36, 421 (2004).
  24. M. Porfiri, C. Maurini, and J. Pouget, Smart Mater. Struct. 16, 323 (2007).
  25. M. Porfiri, Smart Mater. Struct. 18, 015016 (2009).
  26. T. Wallmersperger, B. J. Akle, D. J. Leo, and B. Kroplin, Compos. Sci. Technol. 68, 1173 (2008).
  27. A. J. Bard and L. R. Faulkner, Electrochemical Methods: Fundamentals and Applications (Wiley, Hoboken, NJ, 2001).
  28. S. Nemat-Nasser and Y. Wu, J. Appl. Phys. 93, 5255 (2003).
  29. T. Wallmersperger, B. Kroplin, and R. W. Gulch, Mech. Mater. 36, 411 (2004).
  30. T. Wallmersperger, D. J. Leo, and C. S. Kothera, J. Appl. Phys. 101, 024912 (2007).
  31. N. Abaid, R. S. Eisenberg, and W. Liu, SIAM J. Appl. Dyn. Syst. 7, 1507 (2008).
  32. M. Z. Bazant, K. Thornton, and A. Ajdari, Phys. Rev. E 70, 021506 (2004).
  33. B. Eisenberg and W. Liu, SIAM J. Appl. Math. 38, 1932 (2007).
  34. M. Porfiri, Phys. Rev. E 79, 041503 (2009).
  35. L. I. Daikhin, A. A. Kornyshev, and M. Urbakh, Phys. Rev. E 53, 6192 (1996).
  36. M. S. Kilic, M. Z. Bazant, and A. Ajdari, Phys. Rev. E 75, 021502 (2007).
  37. M. S. Kilic, M. Z. Bazant, and A. Ajdari, Phys. Rev. E 75, 021503 (2007).
  38. M. Z. Bazant, K. T. Chu, and B. J. Bayly, SIAM J. Appl. Math. 65, 1463 (2005).
  39. P. Schaetzel and B. Auclair, Electrochim. Acta 43, 3375 (1998).
  40. J. Fimrite, H. Struchtrup, and N. Djilali, J. Electrochem. Soc. 152, A1804 (2005).
  41. S. Nemat-Nasser and J. Y. Li, J. Appl. Phys. 87, 3321 (2000).
  42. S. Nemat-Nasser and Y. Wu, Proc. SPIE 5051, 245–253 (2003).
  43. S. Nemat-Nasser and S. Zamani, J. Appl. Phys. 100, 064310 (2006).
  44. J. W. Paquette, K. J. Kim, and D. Kim, Sens. Actuators, A 118, 135 (2005).
  45. K. Farinholt and D. J. Leo, J. Appl. Phys. 104, 014512 (2008).
  46. A. H. Nayfeh, Introduction to Perturbation Techniques (Wiley-Interscience, New York, 1981).
  47. L. I. Daikhin, A. A. Kornyshev, and M. Urbakh, J. Chem. Phys. 108, 1715 (1998).
  48. Y. -P. Zhao, G. -C. Wang, T. -M. Lu, G. Palasantzas, and J. T. M. De Hosson, Phys. Rev. B 60, 9157 (1999).
  49. A. Papoulis and S. U. Pillai, Probability, Random Variables and Stochastic Processes, 4th ed. (McGraw-Hill, New York, 2002).
  50. B. Stoimenov, J. Rossiter, and T. Mukai, Proc. SPIE 6413, 641302.1–641302.10 (2007).
  51. B. Stoimenov, J. Rossiter, and T. Mukai, Proc. SPIE 6524, 65240T.1–65240T. 11 (2007).
  52. G. Palasantzas and G. M. E. A. Backx, J. Appl. Phys. 92, 7175 (2002).
  53. B. J. Akle, M. D. Bennet, D. J. Leo, K. B. Wiles, and J. E. McGrath, J. Mater. Sci. 42, 7031 (2007).
  54. K. J. Kim and M. Shahinpoor, Polymer 43, 797 (2002).
  55. K. J. Kim and M. Shahinpoor, Smart Mater. Struct. 12, 65 (2003).
  56. D. Y. Lee, I. -S. Park, M. -H. Lee, K. J. Kim, and S. Heob, Sens. Actuators, A 133, 117 (2007).
  57. B. J. Akle and D. J. Leo, J. Intell. Mater. Syst. Struct. 19, 905 (2008).
  58. S. Nemat-Nasser and Y. Wu, Smart Mater. Struct. 15, 909 (2006).
  59. M. Bennett and D. J. Leo, Sens. Actuators A 115, 79 (2004).
  60. M. D. Bennett, D. J. Leo, G. L. Wilkes, F. L. Beyer, and T. W. Pechar, Polymer 47, 6782 (2006).
  61. S. Torquato, Random Heterogeneous Materials (Springer, New York, 2002).
  62. R. C. McPhedran and D. R. McKenzie, Proc. R. Soc. London, Ser. A 359, 45 (1978).
  63. G. Barbero, J. J. da Silva, and A. M. Figueiredo Neto, J. Appl. Phys. 101, 113705 (2007).
  64. H. Sakaguchi and R. Baba, Phys. Rev. E 75, 051502 (2007).
  65. H. Sakaguchi and R. Baba, Phys. Rev. E 76, 011501 (2007).
  66. T. C. Halsey and M. Leibig, Phys. Rev. A 43, 7087 (1991).
  67. R. Kant and S. K. Rangajaran, J. Electroanal. Chem. 552, 141 (2003).
  68. D. Kim and K. J. Kim, J. Intell. Mater. Syst. Struct. 17, 449 (2006).
  69. Z. Chen, D. Hedgepeth, and X. Tan, Proceedings of the 47th IEEE Conference on Decision and Control, Cancun , Mexico, 9–11 December 2008, pp. 1851–1856.
  70. X. Bao, Y. Bar-Cohen, and S. -S. Lih, Proc. SPIE 4695, 220–227 (2002).
  71. L. I. Daikhin, A. A. Kornyshev, and M. Urbakh, Electrochim. Acta 42, 2853 (1997).
  72. G. Palasantzas, J. Appl. Phys. 98, 034505 (2005).

CITING ARTICLES

For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.