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Polarization direction and stability in ferroelectric lead titanate thin films

J. Appl. Phys. 106, 084104 (2009); doi:10.1063/1.3240331

Published 26 October 2009

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Ø. Dahl, J. K. Grepstad, and T. Tybell
Department of Electronics and Telecommunications, Norwegian University of Science and Technology, O.S. Bragstads Plass 2a, NO-7491 Trondheim, Norway
In this article, we examine the initial polarization of PbTiO3 thin films grown epitaxially on SrRuO3 electrodes. It is found that the as-grown predominant polarization is directed toward the SrRuO3 bottom electrode in films thinner than 20 nm and directed toward the top surface in thicker films. The data is interpreted in terms of a Landau–Ginzburg–Devonshire model for a semiconducting ferroelectric with asymmetric boundary conditions. Based on the measured hysteresis loops and the stability of the two polarization directions with time, it is concluded that charged defects serve to impose a preferential downward polarization in very thin films. ©2009 American Institute of Physics
History: Received 3 July 2009; accepted 6 September 2009; published 26 October 2009
Permalink: http://link.aip.org/link/?JAPIAU/106/084104/1
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KEYWORDS and PACS

Keywords
PACS
  • 77.22.Ej
    Dielectric polarization and depolarization
  • 77.80.Dj
    Ferroelectric domain structure; hysteresis
  • 77.80.Fm
    Ferroelectric switching phenomena
  • 68.55.aj
    Insulator thin film nucleation and growth
  • 77.84.Dy
    Dielectric, piezoelectric, and ferroelectric niobates, titanates, tantalates, PZT ceramics, etc
  • 77.55.+f
    Dielectric thin films
  • YEAR: 2009

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PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
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REFERENCES (34)
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