Journal of Applied Physics
Search:
   
 
 
 
Previous Article
Diffracted magneto-optical Kerr effect of a Ni magnetic grating
We report the results of a joint experimental and theoretical investigation focused on the magneto-optical (MO) properties of one-dimensional magnetic grating structure made of Ni. It was found that t...
Next Article
Investigation of doped calcium aluminosilicate glass: A coupling between thermal-expansion and thermal-diffusion models for assessment of nonradiative relaxation time and characteristic diffusion time
This paper discusses the use of photoacoustic models to obtain the nonradiative relaxation time () and characteristic diffusion time () for a sample showing visible absorption bands from fluorescent i...

Spectroscopic determination of the doping and mobility of terahertz quantum cascade structures

J. Appl. Phys. 106, 093104 (2009); doi:10.1063/1.3247973

Published 5 November 2009

You are not logged in to this journal. Log in

J. Lloyd-Hughes, Y. L. Delley, G. Scalari, M. Fischer, V. Liverini, M. Beck, and J. Faist
Institute for Quantum Electronics, ETH Zurich, 8092 Zurich, Switzerland
Terahertz time-domain spectroscopy is shown to provide a convenient and rapid means to measure the conductivity of individual layers in semiconductor heterostructures such as terahertz quantum cascade lasers. By modeling the complex transmission at terahertz frequencies, the electron density and the in-plane momentum scattering time of the active regions and doped contact layers were determined for both GaAs/AlGaAs and InGaAs/InAlAs epilayers. The measured temperature dependence of the electron scattering rate revealed the significance of impurity and LO phonon scattering. The implications for laser operation at room temperature are discussed by considering the changes in absorption and resonant tunneling current with temperature. ©2009 American Institute of Physics
History: Received 15 September 2009; accepted 17 September 2009; published 5 November 2009
Permalink: http://link.aip.org/link/?JAPIAU/106/093104/1
BUY THIS ARTICLE   (US$24)
Download HTML Download Sectioned HTML Download PDF (172 kB) View Cart

KEYWORDS and PACS

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (19)

For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. J. Faist, F. Capasso, D. L. Sivco, C. Sirtori, A. L. Hutchinson, and A. Y. Cho, Science 264, 553 (1994).
  2. R. Kohler, A. Tredicucci, F. Beltram, H. E. Beere, E. H. Linfield, A. G. Davies, D. A. Ritchie, R. C. Iotti, and F. Rossi, Nature (London) 417, 156 (2002).
  3. G. Scalari, C. Walther, M. Fischer, R. Terazzi, H. Beere, D. Ritchie, and J. Faist, Laser Photonics Rev. 3, 45 (2009).
  4. M. Giehler, R. Hey, H. Kostial, S. Cronenberg, T. Ohtsuka, L. Schrottke, and H. T. Grahn, Appl. Phys. Lett. 82, 671 (2003).
  5. H. C. Liu, M. Wachter, D. Ban, Z. R. Wasilewski, M. Buchanan, G. C. Aers, J. C. Cao, S. L. Feng, B. S. Williams, and Q. Hu, Appl. Phys. Lett. 87, 141102 (2005).
  6. A. Benz, G. Fasching, A. M. Andrews, M. Martl, K. Unterrainer, T. Roch, W. Schrenk, S. Golka, and G. Strasser, Appl. Phys. Lett. 90, 101107 (2007).
  7. S. Kohen, B. S. Williams, and Q. Hu, J. Appl. Phys. 97, 053106 (2005).
  8. R. F. Kazarinov and R. A. Suris, Sov. Phys. Semicond. 5, 707 (1971).
  9. M. B. Johnston, L. M. Herz, A. L. T. Khan, A. Kohler, A. G. Davies, and E. H. Linfield, Chem. Phys. Lett. 377, 256 (2003).
  10. G. Scalari, M. I. Amanti, M. Fischer, R. Terazzi, C. Walther, M. Beck, and J. Faist, Appl. Phys. Lett. 94, 041114 (2009).
  11. The MQW structure was (from the top of the structure, with layer thicknesses in nanometers): 5.0; 85×(35.0[underaccent underbar [below] /4.[bold 0][underaccent underbar [below] /20.0[underaccent underbar [below] /35.0); 35.0[underaccent underbar [below]  ; 300. Here, the barrier layers (underlined) are Al0.15Ga0.85As and the wells are GaAs. Doped layers are in bold; the top and bottom contact were silicon-doped at 2×1018  cm−3, while the modulation doping in the 4 nm Al0.15Ga0.85As region was 1×1018  cm−3.
  12. J. Kroll, J. Darmo, and K. Unterrainer, Opt. Express 15, 6552 (2007).
  13. M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge University Press, Cambridge, 2007).
  14. The lifetime of the heavily doped contacts was found to be weakly frequency dependent, reducing by a factor of two across our spectral range. This frequency dependence was included in the data presented here, and will be discussed in a future publication.
  15. J. Lloyd-Hughes, H. E. Beere, D. A. Ritchie, and M. B. Johnston, Phys. Rev. B 77, 125322 (2008).
  16. P. Y. Yu and M. Cardona, Fundamentals of Semiconductors, 3rd ed. (Springer, New York, 2003).
  17. T. Unuma, M. Yoshita, T. Noda, H. Sakaki, and H. Akiyama, J. Appl. Phys. 93, 1586 (2003).
  18. N. A. Kabir, Y. Yoon, J. R. Knab, J. Y. Chen, A. G. Markelz, J. L. Reno, Y. Sadofyev, S. Johnson, Y. H. Zhang, and J. P. Bird, Appl. Phys. Lett. 89, 132109 (2006).
  19. C. Sirtori, F. Capasso, J. Faist, A. L. Hutchinson, D. L. Sivco, and A. Y. Cho, IEEE J. Quantum Electron. 34, 1722 (1998).

CITING ARTICLES

For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.