Optically active Er3+ ions in SiO2 codoped with Si nanoclusters
J. Appl. Phys. 106, 093107 (2009); doi:10.1063/1.3253753
Published 6 November 2009
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Optical properties of directly excited erbium (Er3+) ions have been studied in silicon rich silicon oxide materials codoped with Er3+. The spectral dependence of the direct excitation cross section (
dir) of the Er3+ atomic 4I15/2
4I11/2 transition (around 0.98 µm) has been measured by time resolved µ-photoluminescence measurements. We have determined that
dir is 9.0±1.5×10−21 cm2 at 983 nm, at least twice larger than the value determined on a stoichiometric SiO2 matrix. This result, in combination with a measurement of the population of excited Er3+ as a function of the pumping flux, has allowed quantifying accurately the amount of optically active Er3+. This concentration is, in the best of the cases, 26% of the total Er population measured by secondary ion mass spectrometry, which means that only this percentage could provide optical gain in an eventual optical amplifier based on this material.
©2009 American Institute of Physics
dir) of the Er3+ atomic 4I15/2
4I11/2 transition (around 0.98 µm) has been measured by time resolved µ-photoluminescence measurements. We have determined that
dir is 9.0±1.5×10−21 cm2 at 983 nm, at least twice larger than the value determined on a stoichiometric SiO2 matrix. This result, in combination with a measurement of the population of excited Er3+ as a function of the pumping flux, has allowed quantifying accurately the amount of optically active Er3+. This concentration is, in the best of the cases, 26% of the total Er population measured by secondary ion mass spectrometry, which means that only this percentage could provide optical gain in an eventual optical amplifier based on this material.
©2009 American Institute of Physics
| History: | Received 27 May 2009; accepted 29 September 2009; published 6 November 2009 |
| Permalink: |
http://link.aip.org/link/?JAPIAU/106/093107/1 |
KEYWORDS and PACS
doping profiles,
erbium,
nanostructured materials,
photoluminescence,
secondary ion mass spectra,
silicon,
silicon compounds,
stoichiometry,
time resolved spectra
- 78.55.Hx
Photoluminescence in solid inorganic materials - 78.67.Bf
Optical properties of nanocrystals and nanoparticles - 61.50.Nw
Crystal stoichiometry - 79.20.Rf
Atomic, molecular and ion beam impact and interactions with surfaces - 81.07.Bc
Nanocrystalline materials: fabrication and characterization - 78.47.Cd
Time-resolved luminescence in condensed matter - 61.72.up
Doping and impurity implantation in other materials - YEAR: 2009
PUBLICATION DATA
0021-8979 (print)
1089-7550 (online)
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