Surface modification of magnetic recording media by filtered cathodic vacuum arc
J. Appl. Phys. 106, 093504 (2009); doi:10.1063/1.3245399
Published 5 November 2009
You are logged in to this journal.
Surface modification of a magnetic recording medium was accomplished by filtered cathodic vacuum arc (FCVA). The carbon overcoat of thin-film disks was removed by Ar+ ion sputter etching in vacuum to prevent oxidation of the exposed magnetic medium, which was then modified by FCVA carbon plasma under conditions of zero and −100 V pulsed substrate bias. Monte Carlo simulations performed with the T-DYN code, x-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), and surface force microscopy (SFM) provided insight into carbon implantation profiles, surface chemical composition, roughness, and nanomechanical properties of the surface-treated magnetic medium. The dependence of surface modification on the FCVA treatment conditions is discussed in the context of T-DYN, XPS, AFM, and SFM results. The findings of this study demonstrate the potential of FCVA to provide overcoat-free magnetic recording media exhibiting oxidation resistance and enhanced nanomechanical properties.
©2009 American Institute of Physics
| History: | Received 24 May 2009; accepted 17 September 2009; published 5 November 2009 |
| Permalink: |
http://link.aip.org/link/?JAPIAU/106/093504/1 |
KEYWORDS and PACS
atomic force microscopy,
boron alloys,
chromium alloys,
cobalt alloys,
hard discs,
ion implantation,
magnetic thin films,
metallic thin films,
Monte Carlo methods,
nanomechanics,
plasma materials processing,
platinum alloys,
sputter etching,
surface composition,
surface roughness,
surface treatment,
vacuum arcs,
X-ray photoelectron spectra
- 85.70.Li
Other magnetic recording and storage devices - 81.05.Bx
Metals, semimetals, and alloys: fabrication, treatment, testing and analysis - 52.77.Bn
Etching and cleaning in plasmas - 68.35.Gy
Mechanical properties and surface strains of solid surfaces and interfaces - 75.50.Ss
Magnetic recording materials - 68.55.Ln
Thin film defects and impurities - YEAR: 2009
PUBLICATION DATA
0021-8979 (print)
1089-7550 (online)
REFERENCES (36)
-
J. Gao, E. Liu, D. L. Butler, and A. Zeng, Surf. Coat. Technol. 176, 93 (2003). [Inspec]
-
P. Bernhard, Ch. Ziethen, R. Ohr, H. Hilgers, and G. Schönhense, Surf. Coat. Technol. 180–181, 621 (2004). [Inspec]
-
A. C. Ferrari, Surf. Coat. Technol. 180–181, 190 (2004). [Inspec]
-
J. Robertson, Thin Solid Films 383, 81 (2001). [Inspec] [ISI]
-
P. R. Goglia, J. Berkowitz, J. Hoehn, A. Xidis, and L. Stover, Diamond Relat. Mater. 10, 271 (2001). [Inspec] [ISI]
-
D. Liu, G. Benstetter, and E. Lodermeier, Thin Solid Films 436, 244 (2003).
-
T. Yamamoto and H. Hyodo, Tribol. Int. 36, 483 (2003).
-
D. Liu, G. Benstetter, E. Lodermeier, X. Chen, J. Ding, Y. Liu, J. Zhang, and T. Ma, Diamond Relat. Mater. 12, 1594 (2003).
-
B. Schultrich, H. -J. Scheibe, D. Drescher, and H. Ziegele, Surf. Coat. Technol. 98, 1097 (1998). [ISI]
-
H. -S. Zhang and K. Komvopoulos, Rev. Sci. Instrum. 79, 073905 (2008). [MEDLINE]
-
H. -S. Zhang and K. Komvopoulos, J. Appl. Phys. 105, 083305 (2009).
-
P. J. Fallon, V. S. Veerasamy, C. A. Davis, J. Robertson, G. A. J. Amaratunga, W. I. Milne, and J. Koskinen, Phys. Rev. B 48, 4777 (1993). [MEDLINE]
-
G. M. Pharr, D. L. Callahan, S. D. McAdams, T. Y. Tsui, S. Anders, A. Anders, J. W. Ager III, I. G. Brown, C. S. Bhatia, S. R. P. Silva, and J. Robertson, Appl. Phys. Lett. 68, 779 (1996).
-
V. S. Veerasamy, G. A. J. Amaratunga, W. I. Milne, J. Robertson, and P. J. Fallon, J. Non-Cryst. Solids 164–166, 1111 (1993). [Inspec]
-
R. G. Lacerda, P. Hammer, C. M. Lepienski, F. Alvarez, and F. C. Marques, J. Vac. Sci. Technol. A 19, 971 (2001).
-
Y. Lifshitz, C. D. Roux, K. Boyd, W. Eckstein, and J. W. Rabalais, Nucl. Instrum. Methods Phys. Res. B 83, 351 (1993). [Inspec] [ISI]
-
Y. Lifshitz, G. D. Lempert, and E. Grossman, Phys. Rev. Lett. 72, 2753 (1994). [MEDLINE]
-
E. Byon and A. Anders, J. Appl. Phys. 93, 1899 (2003).
-
Y. Lifshitz, S. R. Kasi, J. W. Rabalais, and W. Eckstein, Phys. Rev. B 41, 10468 (1990). [MEDLINE]
-
R. Kosiba and G. Ecke, Nucl. Instrum. Methods Phys. Res. B 187, 36 (2002). [Inspec] [ISI]
-
G. Ecke, R. Kosiba, V. Kharlamov, Y. Trushin, and J. Pezoldt, Nucl. Instrum. Methods Phys. Res. B 196, 39 (2002). [ISI]
-
J. Biersack, Nucl. Instrum. Methods Phys. Res. B 153, 398 (1999). [Inspec] [ISI]
-
Y. Kudriavtsev, A. Villegas, A. Godines, and R. Asomoza, Appl. Surf. Sci. 239, 273 (2005). [Inspec]
-
W. Lu and K. Komvopoulos, ASME J. Tribol. 123, 641 (2001).
-
J. L. Endrino, R. Escobar Galindo, H. -S. Zhang, M. Allen, R. Gago, A. Espinosa, and A. Anders, Surf. Coat. Technol. 202, 3675 (2008). [Inspec]
-
W. Lu, K. Komvopoulos, P. Patsalas, C. Charitidis, M. Gioti, and S. Logothetidis, Surf. Coat. Technol. 168, 12 (2003). [Inspec]
-
K. S. Kim, Phys. Rev. B 11, 2177 (1975).
-
D. A. Shirley, Phys. Rev. B 5, 4709 (1972).
-
W. Lu, K. Komvopoulos, and S. W. Yeh, J. Appl. Phys. 89, 2422 (2001). [ISI]
-
D. Wan and K. Komvopoulos, J. Phys. Chem. C 111, 9891 (2007).
-
H. -S. Zhang, J. L. Endrino, and A. Anders, Appl. Surf. Sci. 255, 2551 (2008) (ScienceDirect).
-
S. T. Jackson and R. G. Nuzzo, Appl. Surf. Sci. 90, 195 (1995). [Inspec] [ISI]
-
J. Diaz, G. Paolicelli, S. Ferrer, and F. Comin, Phys. Rev. B 54, 8064 (1996). [ISI] [MEDLINE]
-
P. C. Kelires, M. Gioti, and S. Logothetidis, Phys. Rev. B 59, 5074 (1999). [ISI]
-
C. A. Davis, K. M. Knowles, and G. A. J. Amaratunga, Surf. Coat. Technol. 76–77, 316 (1995). [Inspec] [ISI]
-
L. Kogut and K. Komvopoulos, J. Mater. Res. 19, 3641 (2004). [ISI]






