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Nanoindentation-induced phase transformation in relaxed and unrelaxed ion-implanted amorphous germanium

J. Appl. Phys. 106, 093509 (2009); doi:10.1063/1.3255999

Published 6 November 2009

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D. J. Oliver,1 J. E. Bradby,2 S. Ruffell,2 J. S. Williams,2 and P. Munroe3
1Department of Physics, McGill University, Montréal, Québec H3A 2T8, Canada
2Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, Australian Capital Territory 0200, Australia
3Electron Microscope Unit, University of New South Wales, Sydney, New South Wales 2052, Australia
We have investigated nanoindentation-induced plastic deformation in amorphous germanium (a-Ge) prepared by high-energy self-ion implantation. Using cross-sectional transmission electron microscopy, micro-Raman spectroscopy, and force-displacement curve analysis, we find strong evidence for a pressure-induced metallic phase transformation during indentation. Crystalline diamond-cubic Ge-I is observed in residual indents. Relaxed and unrelaxed structural states of a-Ge exhibit similar behavior on loading, but transform at different pressures on unloading. Both forms are markedly softer mechanically than crystalline Ge. These results assist in furthering the understanding of the intriguing phenomenon known as “explosive crystallization.” ©2009 American Institute of Physics
History: Received 26 August 2009; accepted 29 September 2009; published 6 November 2009
Permalink: http://link.aip.org/link/?JAPIAU/106/093509/1
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KEYWORDS and PACS

Keywords
PACS
  • 62.20.fq
    Plasticity and superplasticity of solids
  • 81.40.Lm
    Deformation, plasticity, and creep
  • 78.30.Am
    Infrared and Raman spectra in elemental semiconductors and insulators
  • 61.72.uf
    Doping and impurity implantation in germanium and silicon
  • 64.70.dg
    Crystallization of specific substances (solid-liquid transitions)
  • YEAR: 2009

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

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