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How to measure quantum yields in scattering media: Application to the quantum yield measurement of fluorescein molecules encapsulated in sub-100 nm silica particles

J. Appl. Phys. 106, 094304 (2009); doi:10.1063/1.3248302

Published 6 November 2009

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M. Martini,1,2 M. Montagna,2 M. Ou,1 O. Tillement,3 S. Roux,3 and P. Perriat1
1MATEIS, INSA-Lyon, Université de Lyon, 69621 Villeurbanne Cedex, France
2Dipartimento di Fisica, Università di Trento, 38050 Trento, Italy
3Laboratoire de Physico-Chimie des Matériaux Luminescents, Université Claude Bernard Lyon 1, 69622 Villeurbanne Cedex, France

Dye quantum yield is generally measured using the method of Williams, which consists in comparing the absorbance and the emission of the dye to test with those of a reference. Unfortunately, this method is no more applicable when the sample presents some significant scattering which is, for instance, the case when the dyes are encapsulated in silica particles with a size below 100 nm. Indeed the photons scattered by the particles are further absorbed by the dyes and generate an additional light emission leading to an overestimation of the quantum yield. Nevertheless, the paper shows that the Williams's method can be still applied if the sample is compared with a reference that has exactly the same scattering properties than those of the sample. In the case of a test sample consisting of dyes encapsulated within particles, such a reference can be easily realized by incorporating in a solution of reference dyes, an adequate proportion of particles with the same size than those of the test sample. We prove theoretically and experimentally that relevant values of quantum yield are then obtained. ©2009 American Institute of Physics
History: Received 2 March 2009; accepted 22 September 2009; published 6 November 2009
Permalink: http://link.aip.org/link/?JAPIAU/106/094304/1
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KEYWORDS and PACS

Keywords
PACS
  • 78.55.-m
    Photoluminescence, properties and materials (condensed matter)
  • YEAR: 2009

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

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