Correlated growth of organic material tris (8-hydroxyquinoline) aluminum (Alq3) and its relation to optical properties
J. Appl. Phys. 106, 096101 (2009); doi:10.1063/1.3247587
Published 3 November 2009
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We report slow correlated growth mode in energetic cluster vapor deposited organic light emissive material tris(8-hydroxyquinoline) aluminum from 5 to 100 nm. Phase modulated atomic force microscopy shows very slow grain growth with thickness, with very small phase differences within the film. Fractal dimension calculated from correlation function shows growth process above 10 nm consistent with diffusion-limited aggregation. For low thickness (5 nm), photoluminescence measurement shows the emission peak is shifted by ~0.4 eV toward lower wavelength.
©2009 American Institute of Physics
| History: | Received 29 June 2009; accepted 17 September 2009; published 3 November 2009 |
| Permalink: |
http://link.aip.org/link/?JAPIAU/106/096101/1 |
KEYWORDS and PACS
aggregation,
atomic force microscopy,
fractals,
grain growth,
organic semiconductors,
photoluminescence,
semiconductor growth,
semiconductor thin films,
vapour deposition
- 78.66.Qn
Optical properties of polymers; organic compounds (thin films) - 78.55.Kz
Photoluminescence in solid organic materials - 68.55.ag
Semiconductor thin film nucleation and growth - 81.15.-z
Methods of deposition of films and coatings - 61.43.Hv
Fractals in disordered solids; macroscopic aggregates - YEAR: 2009
PUBLICATION DATA
0021-8979 (print)
1089-7550 (online)
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