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Coverage, lateral order, and vibrations of atomic nitrogen on Ru(0001)

J. Chem. Phys. 105, 8944 (1996); doi:10.1063/1.472624

Issue Date: 15 November 1996

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H. Dietrich, K. Jacobi, and G. Ertl
Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-14195 Berlin, Germany
The N/Ru(0001) system was studied by thermal desorption spectroscopy (TDS), low-energy electron diffraction (LEED), and high-resolution electron energy-loss spectroscopy (HREELS). Atomic nitrogen was prepared by NH3 decomposition at sample temperatures decreasing from 500 to 350 K during NH3 exposure. A maximum N coverage of thetaN=0.38 could thus be achieved. [square root of 3], split 2×2 and 2×2 LEED patterns were observed for decreasing thetaN. After NH3 decomposition and before annealing the sample to a temperature above 400 K, the surface is composed of adsorbed N, H, and NH species. This composite layer exhibits a split [square root of 3] LEED pattern due to domains of size 4 with heavy walls. This phase decays through dissociation of NH leading to sharp first-order type desorption peaks of H2 and N2. From the weak intensity of the nu(Ru–NH) stretch mode it is concluded that NH is adsorbed at threefold-hollow sites. The energy of the nu(Ru–N) mode shifts from 70.5 to 75.5 meV when thetaN is increased from 0.25 to 0.38. ©1996 American Institute of Physics.
History: Received 13 June 1996; accepted 14 August 1996
Permalink: http://link.aip.org/link/?JCPSA6/105/8944/1
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KEYWORDS and PACS

Keywords
PACS
  • 82.65.Pa
    Physical Chemistry Surface and interface chemistry Surface-enhanced molecular states and other gassurface interactions
  • 34.50.Dy
    Atomic and molecular collision processes and interactions Scattering of atoms, molecules, and ions Interactions of atoms, molecules, and their ions with surfaces; photon and electron emission; neutralization of ions
  • 61.14.Hg
    Structure of solids and liquids; crystallography Electron diffraction and scattering Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED)
  • YEAR: 1996

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PUBLICATION DATA

ISSN:
0021-9606 (print)   1089-7690 (online)
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