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Tungsten nanotip fabrication by spatially controlled field-assisted reaction with nitrogen

J. Chem. Phys. 124, 204716 (2006); doi:10.1063/1.2198536

Published 31 May 2006

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Moh'd Rezeq
National Institute for Nanotechnology, NRC, Edmonton, Alberta T6G 2V4, Canada and Department of Physics, 412 Avadh Bhatia Physics Laboratory, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

Jason Pitters
National Institute for Nanotechnology, NRC, Edmonton, Alberta T6G 2V4, Canada

Robert Wolkow
National Institute for Nanotechnology, NRC, Edmonton, Alberta T6G 2V4, Canada and Department of Physics, 412 Avadh Bhatia Physics Laboratory, University of Alberta, Edmonton, Alberta T6G 2J1, Canada
In this report we present a straightforward new technique for fabricating nanotips. This approach is based on spatially controlling the reaction of nitrogen gas with the surface atoms of a tungsten tip in a field ion microscope (FIM). Confining this field-assisted etching reaction to the shank has enabled us to produce single-atom tips with an apex radius far sharper than the nominal 10  nm radius of curvature tips we start with. Tip sharpening is evidenced in several ways. The FIM imaging voltage drops dramatically from, typically, 4.4  to  1.6  kV. Nanotip formation is also evident from the increase in the FIM magnification and the decrease in the apex area, which are monitored throughout the experiment. A subsequent field evaporation allows the nanotip to be sequentially deconstructed to further describe the extraordinary sharp tip that was formed. We also demonstrate the utility of these nanotips for the scanning tunneling microscope. ©2006 American Institute of Physics
History: Received 29 November 2005; accepted 29 March 2006; published 31 May 2006
Permalink: http://link.aip.org/link/?JCPSA6/124/204716/1
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KEYWORDS and PACS

Keywords
PACS
  • 81.16.-c
    Methods of nanofabrication and processing
  • 81.07.-b
    Nanoscale materials and structures: fabrication and characterization
  • 82.65.+r
    Surface and interface chemistry; heterogeneous catalysis at surfaces
  • 79.70.+q
    Field emission, ionization, evaporation, and desorption
  • 68.37.Ef
    Scanning tunneling microscopy of surfaces, interfaces and thin films including chemistry induced with STM
  • YEAR: 2006

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PUBLICATION DATA

ISSN:
0021-9606 (print)   1089-7690 (online)
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