Tungsten nanotip fabrication by spatially controlled field-assisted reaction with nitrogen
J. Chem. Phys. 124, 204716 (2006); doi:10.1063/1.2198536
Published 31 May 2006
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In this report we present a straightforward new technique for fabricating nanotips. This approach is based on spatially controlling the reaction of nitrogen gas with the surface atoms of a tungsten tip in a field ion microscope (FIM). Confining this field-assisted etching reaction to the shank has enabled us to produce single-atom tips with an apex radius far sharper than the nominal 10 nm radius of curvature tips we start with. Tip sharpening is evidenced in several ways. The FIM imaging voltage drops dramatically from, typically, 4.4 to 1.6 kV. Nanotip formation is also evident from the increase in the FIM magnification and the decrease in the apex area, which are monitored throughout the experiment. A subsequent field evaporation allows the nanotip to be sequentially deconstructed to further describe the extraordinary sharp tip that was formed. We also demonstrate the utility of these nanotips for the scanning tunneling microscope.
©2006 American Institute of Physics
| History: | Received 29 November 2005; accepted 29 March 2006; published 31 May 2006 |
| Permalink: |
http://link.aip.org/link/?JCPSA6/124/204716/1 |
KEYWORDS and PACS
tungsten,
nitrogen,
nanostructured materials,
nanotechnology,
surface chemistry,
etching,
field evaporation,
scanning tunnelling microscopy
- 81.16.-c
Methods of nanofabrication and processing - 81.07.-b
Nanoscale materials and structures: fabrication and characterization - 82.65.+r
Surface and interface chemistry; heterogeneous catalysis at surfaces - 79.70.+q
Field emission, ionization, evaporation, and desorption - 68.37.Ef
Scanning tunneling microscopy of surfaces, interfaces and thin films including chemistry induced with STM - YEAR: 2006
RELATED DATABASES
PUBLICATION DATA
0021-9606 (print)
1089-7690 (online)
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