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Effect of surface roughness on rate-dependent slip in simple fluids

J. Chem. Phys. 127, 144708 (2007); doi:10.1063/1.2796172

Published 10 October 2007

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Nikolai V. Priezjev
Department of Mechanical Engineering, Michigan State University, East Lansing, Michigan 48824, USA
Molecular dynamics simulations are used to investigate the influence of molecular-scale surface roughness on the slip behavior in thin liquid films. The slip length increases almost linearly with the shear rate for atomically smooth rigid walls and incommensurate structures of the liquid/solid interface. The thermal fluctuations of the wall atoms lead to an effective surface roughness, which makes the slip length weakly dependent on the shear rate. With increasing the elastic stiffness of the wall, the surface roughness smoothes out and the strong rate dependence is restored again. Both periodically and randomly corrugated rigid surfaces reduce the slip length and its shear rate dependence. ©2007 American Institute of Physics
History: Received 30 May 2007; accepted 18 September 2007; published 10 October 2007
Permalink: http://link.aip.org/link/?JCPSA6/127/144708/1
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KEYWORDS and PACS

Keywords
PACS
  • 68.15.+e
    Liquid thin films
  • 61.20.Ja
    Computer simulation of liquid structure
  • 61.25.Em
    Structure of molecular liquids
  • 62.20.Dc
    Elasticity, elastic constants
  • 62.20.Fe
    Deformation and plasticity including yield, ductility, and superplasticity
  • YEAR: 2007

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PUBLICATION DATA

ISSN:
0021-9606 (print)   1089-7690 (online)
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REFERENCES (42)
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For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. G. E. Karniadakis, A. Beskok, and N. Aluru, Microflows and Nanoflows: Fundamentals and Simulation (Springer, New York, 2005).
  2. E. Schnell, J. Appl. Phys. 27, 1149 (1956).
  3. N. V. Churaev, V. D. Sobolev, and A. N. Somov, J. Colloid Interface Sci. 97, 574 (1984).
  4. C. H. Choi, K. J. A. Westin, and K. S. Breuer, Physiol. Behav. 15, 2897 (2003).
  5. R. G. Horn, O. I. Vinogradova, M. E. Mackay, and N. Phan-Thien, J. Chem. Phys. 112, 6424 (2000).
  6. J. Baudry, E. Charlaix, A. Tonck, and D. Mazuyer, Langmuir 17, 5232 (2001).
  7. Y. Zhu and S. Granick, Phys. Rev. Lett. 87, 096105 (2001).
  8. O. I. Vinogradova and G. E. Yakubov, Phys. Rev. E 73, 045302(R) (2006).
  9. C. Cottin-Bizonne, B. Cross, A. Steinberger, and E. Charlaix, Phys. Rev. Lett. 94, 056102 (2005).
  10. L. Joly, C. Ybert, and L. Bocquet, Phys. Rev. Lett. 96, 046101 (2006).
  11. C. Neto, D. R. Evans, E. Bonaccurso, H. J. Butt, and V. S. J. Craig, Rep. Prog. Phys. 68, 2859 (2005).
  12. P. A. Thompson and M. O. Robbins, Phys. Rev. A 41, 6830 (1990).
  13. E. D. Smith, M. O. Robbins, and M. Cieplak, Phys. Rev. B 54, 8252 (1996).
  14. J. Koplik, J. R. Banavar, and J. F. Willemsen, Phys. Fluids A 1, 781 (1989).
  15. L. Bocquet and J.-L. Barrat, Phys. Rev. E 49, 3079 (1994).
  16. J.-L. Barrat and L. Bocquet, Phys. Rev. Lett. 82, 4671 (1999).
  17. K. P. Travis and K. E. Gubbins, J. Chem. Phys. 112, 1984 (2000).
  18. M. Cieplak, J. Koplik, and J. R. Banavar, Phys. Rev. Lett. 86, 803 (2001).
  19. V. P. Sokhan, D. Nicholson, and N. Quirke, J. Chem. Phys. 115, 3878 (2001).
  20. R. Khare, P. Keblinski, and A. Yethiraj, Int. J. Heat Mass Transfer 49, 3401 (2006).
  21. J.-L. Barrat and L. Bocquet, Faraday Discuss. 112, 119 (1999).
  22. A. Jabbarzadeh, J. T. Atkinson, and R. I. Tanner, J. Chem. Phys. 110, 2612 (1999).
  23. P. A. Thompson and S. M. Troian, Nature (London) 389, 360 (1997).
  24. N. V. Priezjev and S. M. Troian, Phys. Rev. Lett. 92, 018302 (2004).
  25. S. C. Yang and L. B. Fang, Mol. Simul. 31, 971 (2005).
  26. S. C. Yang, Microfluid. Nanofluid. 2, 501 (2006).
  27. N. V. Priezjev, Phys. Rev. E 75, 051605 (2007).
  28. T. M. Galea and P. Attard, Langmuir 20, 3477 (2004).
  29. N. V. Priezjev and S. M. Troian, J. Fluid Mech. 554, 25 (2006).
  30. G. He, “Simulation studies of the tribological behavior of molecularly thin films,” Ph.D. Thesis, The Johns Hopkins University, 2002.
  31. J. P. Gao, W. D. Luedtke, and U. Landman, Tribol. Lett. 9, 3 (2000).
  32. A. Jabbarzadeh, J. T. Atkinson, and R. I. Tanner, Phys. Rev. E 61, 690 (2000).
  33. Y. Zhu and S. Granick, Phys. Rev. Lett. 88, 106102 (2002).
  34. T. Schmatko, H. Hervet, and L. Leger, Langmuir 22, 6843 (2006).
  35. J. Sanchez-Reyes and L. A. Archer, Langmuir 19, 3304 (2003).
  36. D. Einzel, P. Panzer, and M. Liu, Phys. Rev. Lett. 64, 2269 (1990).
  37. S. Richardson, J. Fluid Mech. 59, 707 (1973).
  38. N. V. Priezjev, A. A. Darhuber, and S. M. Troian, Phys. Rev. E 71, 041608 (2005).
  39. G. S. Grest and K. Kremer, Phys. Rev. A 33, 3628 (1986).
  40. M. Tsige and G. S. Grest, J. Chem. Phys. 120, 2989 (2004).
  41. M. P. Allen and D. J. Tildesley, Computer Simulation of Liquids (Clarendon, Oxford, 1987).
  42. J. L. Barrat and J. P. Hansen, Basic Concepts for Simple and Complex Liquids (Cambridge University Press, Cambridge, 2003).

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