Electrochemical Deposition of Metallic Nanowires as a Scanning Probe Tip

J. Electrochem. Soc., Volume 156, Issue 10, pp. D431-D438 (2009)

(Published 20 August 2009)

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ABSTRACT

REFERENCES (48)

Munekazu Motoyama,¹ Neil P. Dasgupta,¹ and Fritz B. Prinz^1,2
¹Department of Mechanical Engineering, and
²Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, USA

Thispaper describes Ni electrodeposition as a method of producing metallicnanowires on a scanning probe tip. A polycarbonate porous membranewas used as a template for the growth of nanowireson a Si atomic force microscope (AFM) probe tip. Athin Pt cathode was deposited on the tip apex andonto the underlying porous membrane with the help of afocused ion beam. The number of nanowires deposited on theAFM probe tip was controlled by the cathode area andthe duration of Ni deposition. Surface imaging was performed withthe nanowire AFM probes. Elastic and inelastic deformations of thenanowires were observed, and the related beam mechanics were calculated.

©2009 The Electrochemical Society

History:	Submitted 24 April 2009; revised 29 June 2009; published 20 August 2009
Permalink:	http://dx.doi.org/10.1149/1.3187215

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