Galvanic Corrosion in Metal-Matrix Composites Containing Semiconducting Constituents

J. Electrochem. Soc., Volume 156, Issue 12, pp. C422-C427 (2009)

(Published 2 October 2009)

Content Alerts/

You are not logged in. Log in

ABSTRACT

REFERENCES (29)

CITING ARTICLES

Hongbo Ding and L. H. Hihara
Hawaii Corrosion Laboratory, Department of Mechanical Engineering, University of Hawaii at Manoa, Honolulu, Hawaii 96822, USA

Amodified photochemical-diode (PD) model, designated as a photochemical-corrosion-diode (PCD) model,was proposed for interpreting galvanic corrosion in metal-matrix composites (MMCs)containing semiconducting constituents. The characteristics of the PCD model wereintroduced through direct comparison with that of the PD model.The PCD model was then used to interpret galvanic corrosionin SiC-reinforced Al MMCs. The PCD model and the photoelectrochemicalexperiments on both Al/SiC MMCs and monolithic SiC predicted thatsolar irradiation may affect the corrosion of the Al/SiC MMCs,corroborating well with field experiments.

©2009 The Electrochemical Society

History:	Submitted 20 July 2009; revised 20 August 2009; published 2 October 2009
Permalink:	http://dx.doi.org/10.1149/1.3232299

KEYWORDS and PACS

Keywords

aluminium, corrosion, particle reinforced composites, photochemistry, radiation effects, silicon compounds, wide band gap semiconductors

PACS

81.05.Ni
Dispersion-, fiber-, and platelet-reinforced metal-based composites: fabrication, treatment, testing and analysis
81.65.-b
Surface treatments
82.50.-m
Photochemistry
61.80.Ba
Ultraviolet, visible, and infrared radiation effects
YEAR: 2009