Depth profiling of light elements in materials with high-energy ion beams
The detection and depth profiling of light impurity elements near the surface of solids pose special difficulties of signal/background ratio and kinematics. We review some methods of getting around th...

Deuterium depth profiles in metals using imaging field desorption
Depth profiles of 80-eV deuterium ions implanted in situ into (110) tungsten have been measured by imaging, field-desorption mass spectrometry. The relative abundance of deuterium was measured from th...