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Phys. Rev. E 73, 011603 (2006) [4 pages]

Universal scaling in mixing correlated growth with randomness

A. Kolakowska, M. A. Novotny, and P. S. Verma
Department of Physics and Astronomy, and the ERC Center for Computational Sciences, P.O. Box 5167, Mississippi State, Mississippi 39762-5167, USA
Received 6 September 2005; revised 5 December 2005; published 19 January 2006

We study two-component growth that mixes random deposition (RD) with a correlated growth process that occurs with probability p. We find that these composite systems are in the universality class of the correlated growth process. For RD blends with either Edwards-Wilkinson or Kardar-Parisi-Zhang processes, we identify a nonuniversal exponent in the universal scaling in p.

©2006 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevE.73.011603
DOI: 10.1103/PhysRevE.73.011603
PACS: 81.15.Aa; 02.50.Fz; 05.10.-a; 89.75.Da
  • 81.15.Aa
    Theory and models of film growth
  • 02.50.Fz
    Stochastic analysis
  • 05.10.-a
    Computational methods in statistical physics and nonlinear dynamics
  • 89.75.Da
    Systems obeying scaling laws
  • YEAR: 2006
KEYWORDS: interface roughness, random processes, probability

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