Direct determination of the wave field of an x-ray nanobeam

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Hidekazu Mimura,¹ Hirokatsu Yumoto,¹ Satoshi Matsuyama,¹ Soichiro Handa,¹ Takashi Kimura,¹ Yasuhisa Sano,¹ Makina Yabashi,² Yoshinori Nishino,³ Kenji Tamasaku,³ Tetsuya Ishikawa,³ and Kazuto Yamauchi¹
¹Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka, 565-0871, Japan
²Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun Hyogo, 679-5148, Japan
³RIKEN/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo, 679-5148, Japan

Received 21 May 2007; published 31 January 2008

Wepresent a remarkably accurate method for determining the wave fieldof an x-ray nanobeam. The intensity profile of a beamwas directly measured over a range of three orders ofmagnitude while its phase distribution was successfully recovered using aniterative algorithm. The evolution of the wave field along thebeam propagation direction was precisely simulated, and there was goodagreement with the experimental results.

URL:	http://link.aps.org/doi/10.1103/PhysRevA.77.015812
DOI:	10.1103/PhysRevA.77.015812
PACS:	42.15.Eq; 41.50.+h; 07.85.Fv 42.15.Eq Optical system design 41.50.+h X-ray beam source magnets and X-ray optics for control of particle beams 07.85.Fv X- and γ-ray sources, mirrors, gratings, and detectors YEAR: 2008
KEYWORDS:	iterative methods, X-ray detection

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