Phys. Rev. B 73, 134502 (2006) [9 pages]
Critical currents of ex situ YBa2Cu3O7 thin films on rolling assisted biaxially textured substrates: Thickness, field, and temperature dependencies
Abstract
References (43)
Citing Articles
A. O. Ijaduola, 1 J. R. Thompson, 1,2 R. Feenstra, 2 D. K. Christen, 2 A. A. Gapud, 2 and X. Song31Department of Physics, University of Tennessee, Knoxville, Tennessee 37996-1200, USA
2Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6061, USA
3Applied Superconductivity Center, University of Wisconsin, Madison, Wisconsin 53706-1390, USA
Received 5 December 2005; revised 3 March 2006; published 4 April 2006
The critical current density Jc flowing in thin YBa2Cu3O7 (YBCO) films of various thicknesses d has been studied magnetometrically, both as a function of applied field H and temperature T, with a central objective to determine the dominant source of vortex pinning in these materials. The films, grown by a BaF2 ex situ process and deposited on buffered rolling assisted biaxially textured substrates ("RABiTS") substrates of Ni-5% W, have thicknesses d ranging from 28 nm to 1.5 µm. Isothermal magnetization loops M(H;T) and remanent magnetization Mrem(T) in H=0 were measured with H c-axis (i.e., normal to film plane). The resulting Jc(d) values (obtained from a modified critical state model) increase with thickness d, peak near d~120 nm, and thereafter decrease as the films get thicker. For a wide range of temperatures and intermediate fields, we find Jc H with ~(0.560.69) for all materials. This feature can be attributed to pinning by large random defects, which theoretically has power-law exponent =5/8. Calculated values for the size and density of defects are comparable with those observed by TEM in the films. As a function of temperature, we find Jc(T,sf)~[1(T/Tc)2]n with n~1.21.4. This points to " Tc pinning" (pinning that suppresses Tc locally) in these YBCO materials.
©2006 The American Physical Society
REFERENCES (43)
For access to fully linked references, you need to log in.
For access to fully linked references, you need to Log in.
- G. Blatter, M. V. Feigel'man, V. B. Geshkenbein, A. I. Larkin, and V. M. Vinokur, Rev. Mod. Phys. 66, 1125 (1994).
- A. Goyal, D. P. Norton, J. D. Budai, M. Paranthaman, E. D. Specht, D. M. Kroeger, D. K. Christen, Q. He, B. Saffian, F. A. List, D. F. Lee, P. M. Martin, C. E. Klabunde, E. Hatfield, and V. K. Sikka, Appl. Phys. Lett. 69, 1795 (1996).
- Y. Iijima, N. Tanabe, O. Kohno, and Y. Ikeno, Appl. Phys. Lett. 60, 769 (1992).
- Y. Iijima, K. Onabe, N. Futaki, N. Sadakata, and O. Kohno, J. Appl. Phys. 74, 1905 (1993).
- X. D. Wu, S. R. Foltyn, P. N. Arendt, W. R. Blumenthal, I. H. Campell, J. D. Cotton, J. Y. Coulter, W. L. Hults, M. P. Maley, H. F. Safar, and J. L. Smith, Appl. Phys. Lett. 67, 2397 (1995).
- T. Aytug, M. Paranthaman, J. R. Thompson, A. Goyal, N. Rutter, H. Y. Zhai, A. A. Gapud, A. O. Ijaduola, and D. K. Christen, Appl. Phys. Lett. 83, 3963 (2003).
- Yu N. Ovchinnikov and B. I. Ivlev, Phys. Rev. B 43, 8024 (1991).
- C. J. van der Beek, M. Konczykowski, A. Abal'oshev, I. Abal'osheva, P. Gierlowski, S. J. Lewandowski, M. V. Indenbom, and S. Barbanera, Phys. Rev. B 66, 024523 (2002).
- C. P. Bean, Rev. Mod. Phys. 36, 31 (1964).
- D. R. Nelson and V. M. Vinokur, Phys. Rev. B 48, 13060 (1993).
- T. Aytug, M. Paranthaman, A. A. Gapud, S. Kang, H. M. Christen, K. J. Leonard, P. M. Martin, J. R. Thompson, D. K. Christen, R. Meng, I. Rusakova, C. W. Chu, and T. H. Johansen, J. Appl. Phys. 98, 114309 (2005).
- M. Daeumling and D. C. Larbalestier, Phys. Rev. B 40, 9350 (1989).
- A. Palau, T. Puig, X. Obradors, E. Pardo, C. Navau, A. Sanchez, A. Usoskin, H. C. Freyhardt, L. Fernandez, B. Holzapfel, and R. Feenstra, Appl. Phys. Lett. 84, 230 (2004).
- S. R. Foltyn, H. Wang, L. Civale, Q. X. Jia, P. N. Arendt, B. Maiorov, Y. Li, M. P. Maley, and J. L. MacManus-Driscoll, Appl. Phys. Lett. 87, 162505 (2005).
- Q. Li, M. Suenaga, Z. Ye, S. R. Foltyn, and H. Wang, Appl. Phys. Lett. 84, 3528 (2004).
- S. R. Foltyn, P. Tiwari, R. C. Dye, M. Q. Le, and X. D. Wu, Appl. Phys. Lett. 63, 1848 (1993).
- S. R. Foltyn, Q. C. Jia, P. N. Arendt, L. Kinder, Y. Fan, and J. F. Smith, Appl. Phys. Lett. 75, 3692 (1999).
- S. R. Foltyn, P. N. Arendt, Q. X. Jia, H. Wang, J. L. MacManus-Driscoll, S. Kreiskott, R. F. DePaula, L. Stan, J. R. Groves, and P. C. Dowden, Appl. Phys. Lett. 82, 4519 (2003).
- R. Griessen, Hai-hu Wen, A. J. J. van Dalen, B. Dam, J. Rector, H. G. Schnack, S. Libbrecht, E. Osquiguil, and Y. Bruynseraede, Phys. Rev. Lett. 72, 1910 (1994).
- J. G. Ossandon, J. R. Thompson, D. K. Christen, B. C. Sales, H. R. Kerchner, J. O. Thomson, Y. R. Sun, K. W. Lay, and J. E. Tkaczyk, Phys. Rev. B 45, 12534 (1992).
CITING ARTICLES
For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.
|
A new free weekly publication from APS
|