Analysis of flux pinning in YBa₂Cu₃O₇₋ films by nanoparticle-modified substrate surfaces

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T. Aytug, M. Paranthaman, K. J. Leonard, S. Kang, P. M. Martin, L. Heatherly, A. Goyal, A. O. Ijaduola, J. R. Thompson, and D. K Christen
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

R. Meng, I. Rusakova, and C. W. Chu
Texas Center for Superconductivity, University of Houston, Houston, Texas 77204, USA

Received 2 August 2006; published 6 November 2006

Enhancedin-field critical current density J_c has been achieved in YBa₂Cu₃O₇₋(YBCO) films grown on single crystal and biaxially textured metalsubstrate surfaces that were pretreated with second-phase nanoscale MgO andBaZrO₃ particles. Nanoparticles were applied using wet chemical solution-based approaches.Results obtained in this study are compared with our previousinvestigations on surface modified substrates with sputter processed Ir nanoparticles.Cross-sectional TEM analysis and details of the field-orientation dependence ofJ_c are found to be similar for both sputtered andsolution processed nanoparticle species. Present results show a more uniformdependence of J_c over all orientations of magnetic field, alongwith improved irreversibility behavior. Irrespective of the decoration technique, scalingbehavior of the normalized volume pinning force density, F_p, demonstratesthe similarity of pinning mechanisms for these YBCO films depositedon artificially modified substrates.

URL:	http://link.aps.org/doi/10.1103/PhysRevB.74.184505
DOI:	10.1103/PhysRevB.74.184505
PACS:	74.25.Qt; 74.25.Sv; 74.62.Bf; 74.72.Bk 74.25.Qt Vortex lattices, flux pinning, flux creep in superconductors 74.25.Sv Critical currents in superconductors 74.62.Bf Effects of material synthesis, crystal structure, and chemical composition on superconducting transition temperature 74.72.Bk Y-based cuprates (HTSC) YEAR: 2006
KEYWORDS:	yttrium compounds, barium compounds, high-temperature superconductors, superconducting thin films, flux pinning, critical current density (superconductivity), transmission electron microscopy

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