Single-Shot Spectrometry for X-Ray Free-Electron Lasers

Abstract

References (27)

Citing Articles

Download: PDF (393 kB) or Buy this Article (US$25) (Use Article Pack)

Makina Yabashi,^1,5 Jerome B. Hastings,² Max S. Zolotorev,³ Hidekazu Mimura,⁴ Hirokatsu Yumoto,⁴ Satoshi Matsuyama,⁴ Kazuto Yamauchi,⁴ and Tetsuya Ishikawa^1,5
¹SPring-8/JASRI, Kouto 1-1-1, Sayo, Hyogo 679-5198, Japan
²Stanford Synchrotron Radiation Laboratory/SLAC, Menlo Park, California 94025, USA
³Center for Beam Physics, Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720, USA
⁴Department of Precision Science and Technology, Graduate School of Engineering, University of Osaka, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
⁵SPring-8/RIKEN, Kouto 1-1-1, Sayo, Hyogo 679-5148, Japan

Received 24 May 2006; published 25 August 2006

Anexperimental scheme to realize single-shot spectrometry for the diagnostics ofx-ray free-electron lasers (XFELs) is presented. The combination of anultraprecisely figured mirror and a perfect crystal form a simple,high-precision spectrometer that can cover an energy range from afew eV to a hundred eV with high resolution. Theapplication of the spectrometer to determine XFEL pulse widths wasinvestigated theoretically and experimentally. It has been shown that thepresent system can determine pulse widths from sub-fs to psin a single shot even for spontaneous radiation. The systemcan be easily extended to even shorter pulses.

URL:	http://link.aps.org/doi/10.1103/PhysRevLett.97.084802
DOI:	10.1103/PhysRevLett.97.084802
PACS:	41.50.+h; 07.85.Qe; 42.50.Ar 41.50.+h X-ray beams and X-ray optics 07.85.Qe Synchrotron radiation instrumentation 42.50.Ar Photon statistics and coherence theory YEAR: 2006