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Phys. Rev. Lett. 98, 028101 (2007) [4 pages]

Controlled Manipulation of Atoms in Insulating Surfaces with the Virtual Atomic Force Microscope

T. Trevethan,1 M. Watkins,1 L. N. Kantorovich,2 and A. L. Shluger1
1Department of Physics and Astronomy, University College London, Gower Street, London WC1E 6BT, United Kingdom
2Department of Physics, King's College London, Strand, London WC2R 2LS, United Kingdom

Received 24 February 2006; published 8 January 2007

We predict how single oxygen ions can be manipulated on the MgO (100) surface and demonstrate the possibility of detecting a single-atom event using a noncontact atomic force microscope. The manipulation process is simulated explicitly in real time with a virtual dynamic atomic force microscope including the full response of the instrumentation and demonstrates a strong dependence on temperature. The proposed new atomistic mechanism and protocols for the controlled manipulation of single atoms and vacancies on insulating surfaces may be relevant for anchoring molecules and metal clusters at these surfaces and controlling their electronic properties.

©2007 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevLett.98.028101
DOI: 10.1103/PhysRevLett.98.028101
PACS: 87.64.Dz; 07.79.Lh; 68.37.Ps
  • 87.64.Dz
    Scanning tunneling and atomic force microscopy in biophysics and medical physics
  • 07.79.Lh
    Atomic force microscopes
  • 68.37.Ps
    Atomic force microscopy (AFM) of surfaces, interfaces and thin films
  • YEAR: 2007

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