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Phys. Rev. Lett. 98, 145502 (2007) [4 pages]

Subnanometer-Scale Measurements of the Interaction of Ultrafast Soft X-Ray Free-Electron-Laser Pulses with Matter

Stefan P. Hau-Riege,1 Henry N. Chapman,1 Jacek Krzywinski,2 Ryszard Sobierajski,2 Saša Bajt,1 Richard A. London,1 Magnus Bergh,3 Carl Caleman,3 Robert Nietubyc,2 Libor Juha,4 Jaroslav Kuba,5 Eberhard Spiller,1 Sherry Baker,1 Richard Bionta,1 K. Sokolowski Tinten,6 Nikola Stojanovic,6 Benjawan Kjornrattanawanich,7 Eric Gullikson,8 Elke Plönjes,9 Sven Toleikis,9 and Thomas Tschentscher9
1Lawrence Livermore National Laboratory, Livermore, California 94550, USA
2Institute of Physics PAS, Al. Lotników 32/46, PL-02-668 Warsaw, Poland
3Department of Cell and Molecular Biology, Biomedical Centre, Uppsala University, SE-75124 Uppsala, Sweden
4Institute of Physics AS CR, Na Slovance 2, 182 21 Prague 8, Czech Republic
5Czech Technical University, Zikova 4, 166 36 Prague, Czech Republic
6Institut für Experimentelle Physik, Universität Duisburg-Essen, 47048 Duisburg, Germany
7Universities Space Research Association, NSLS Beamline X24C, Upton, New York 11973, USA
8Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
9Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, D-22607 Hamburg, Germany
Received 5 September 2006; published 4 April 2007

At the recently built FLASH x-ray free-electron laser, we studied the reflectivity of Si/C multilayers with fluxes up to 3×1014 W/cm2. Even though the nanostructures were ultimately completely destroyed, we found that they maintained their integrity and reflectance characteristics during the 25-fs-long pulse, with no evidence for any structural changes over lengths greater than 3 Å. This experiment demonstrates that with intense ultrafast pulses, structural damage does not occur during the pulse, giving credence to the concept of diffraction imaging of single macromolecules.

©2007 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevLett.98.145502
DOI: 10.1103/PhysRevLett.98.145502
PACS: 61.80.Cb; 78.67.-n
  • 61.80.Cb
    X-ray effects
  • 78.67.-n
    Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures
  • YEAR: 2007

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