Phys. Rev. Lett. 98, 217602 (2007) [4 pages]
Suppressed Dependence of Polarization on Epitaxial Strain in Highly Polar Ferroelectrics
Abstract
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Citing Articles
Ho Nyung Lee, 1 Serge M. Nakhmanson, 2 Matthew F. Chisholm, 1 Hans M. Christen, 1 Karin M. Rabe, 2 and David Vanderbilt21Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
2Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854-8019, USA
Received 2 November 2006; published 21 May 2007; publisher error corrected 22 May 2007
A combined experimental and computational investigation of coupling between polarization and epitaxial strain in highly polar ferroelectric PbZr0.2Ti0.8O3 (PZT) thin films is reported. A comparison of the properties of relaxed (tetragonality c/a 1.05) and highly strained (c/a 1.09) epitaxial films shows that polarization, while being amongst the highest reported for PZT or PbTiO3 in either film or bulk forms Pr 82 µC/cm2), is almost independent of the epitaxial strain. We attribute this behavior to a suppressed sensitivity of the A-site cations to epitaxial strain in these Pb-based perovskites, where the ferroelectric displacements are already large, contrary to the case of less polar perovskites, such as BaTiO3. In the latter case, the A-site cation (Ba) and equatorial oxygen displacements can lead to substantial polarization increases.
©2007 The American Physical Society
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