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Phys. Rev. Lett. 98, 269702 (2007) [1 pages]

Lu et al. Reply:

Yonghua Lu,1 M. Munoz,2 C. S. Steplecaru,1 Cheng Hao,1 Ming Bai,1 N. Garcia,1 K. Schindler,2 D. Spoddig,2 and P. Esquinazi2
1Laboratorio de Física de Sistemas Pequeños y Nanotecnología, CSIC Serrano 144, 28006 Madrid, Spain
2Division SUM University of Leipzig Linnéstrasse 5, D-04103 Leipzig, Germany

Received 3 January 2007; published 28 June 2007

A Reply to the Comment by S. Sadewasser and Th. Glatzel.

©2007 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevLett.98.269702
DOI: 10.1103/PhysRevLett.98.269702
PACS: 73.25.+i; 73.43.Fj; 79.60.Jv; 81.05.Uw
  • 73.25.+i
    Surface conductivity and carrier phenomena
  • 73.43.Fj
    Novel experimental methods; measurements (quantum Hall effect)
  • 79.60.Jv
    Photoelectron spectra of interfaces; heterostructures; nanostructures
  • 81.05.Uw
    Carbon, diamond, graphite: fabrication, treatment, testing and analysis
  • YEAR: 2007

See Also

Comment on “Electrostatic Force Microscopy on Oriented Graphite Surfaces: Coexistence of Insulating and Conducting Behaviors”
S. Sadewasser and Th. Glatzel
Phys. Rev. Lett. 98, 269701 (2007)

Electrostatic Force Microscopy on Oriented Graphite Surfaces: Coexistence of Insulating and Conducting Behaviors
Yonghua Lu, M. Muñoz, C. S. Steplecaru et al.
Phys. Rev. Lett. 97, 076805 (2006)

REFERENCES (6)

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Related Articles

  1. Comment on “Electrostatic Force Microscopy on Oriented Graphite Surfaces: Coexistence of Insulating and Conducting Behaviors”
    S. Sadewasser and Th. Glatzel
    Phys. Rev. Lett. 98, 269701 (2007)
  2. Electrostatic Force Microscopy on Oriented Graphite Surfaces: Coexistence of Insulating and Conducting Behaviors
    Yonghua Lu, M. Muñoz, C. S. Steplecaru et al.
    Phys. Rev. Lett. 97, 076805 (2006)


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