Phys. Rev. Lett. 103, 187802 (2009) [4 pages]
Thickness Dependent Phase Behavior of Antiferroelectric Liquid Crystal Films
Abstract
References (23)
No Citing Articles
LiDong Pan, 1 Shun Wang, 1 C. S. Hsu, 2 and C. C. Huang11School of Physics and Astronomy, University of Minnesota, Minneapolis, Minnesota 55455, USA
2Department of Applied Chemistry, National Chiao Tung University, Hsinchu 30050, Taiwan
Received 8 June 2009; published 30 October 2009
Free standing films of a liquid crystal compound with simple surface enhanced order were studied. The resultant phase diagram demonstrates that (1) the short helical pitch smectic-C phase disappears below a film thickness of 10 layers, and (2) the temperature window of a distorted 4 layer smectic-C phase increases dramatically upon decreasing film thickness. The experimental findings were attributed to the reduced dimensionality and enhanced surface effects in thin films. The results of the smectic-C phase are consistent with what have been reported for helically ordered magnetic thin films, with a noticeable difference due to the opposite effect of the surface on ordering in the two systems.
©2009 The American Physical Society
| URL: |
http://link.aps.org/doi/10.1103/PhysRevLett.103.187802
|
| DOI: |
10.1103/PhysRevLett.103.187802 |
| PACS: |
61.30.Hn;
64.70.M-;
77.84.Nh
|
REFERENCES (23)
For access to fully linked references, you need to log in.
For access to fully linked references, you need to Log in.
- P. Mach et al., Phys. Rev. Lett. 81, 1015 (1998).
- P. M. Johnson et al., Phys. Rev. Lett. 84, 4870 (2000);
D. Konovalov et al., Phys. Rev. E 64, 010704(R) (2001);
M. Škarabot et al., Phys. Rev. E 58, 575 (1998).
- M. E. Fisher and W. Selke, Phys. Rev. Lett. 44, 1502 (1980).
- D. A. Olson et al., Phys. Rev. E 66, 021702 (2002).
- M. Čepič et al., J. Chem. Phys. 117, 1817 (2002).
- P. V. Dolganov et al., Phys. Rev. E 67, 041716 (2003).
- M. B. Hamaneh and P. L. Taylor, Phys. Rev. Lett. 93, 167801 (2004);
Phys. Rev. E 72, 021706 (2005).
- C. Y. Chao et al., Phys. Rev. Lett. 86, 4048 (2001).
- E. I. Demikhov, JETP Lett. 61, 977 (1995).
- L. D. Pan et al., Phys. Rev. E 79, 031704 (2009).
- P. M. Johnson et al., Phys. Rev. Lett. 83, 4073 (1999).
- B. K. McCoy et al., Phys. Rev. E 73, 041704 (2006).
- D. Schlauf et al., Phys. Rev. E 60, 6816 (1999).
- A. Fera et al., Phys. Rev. E 64, 021702 (2001).
- P. V. Dolganov et al., Phys. Rev. E 65, 031702 (2002).
- E. Weschke et al., Phys. Rev. Lett. 93, 157204 (2004).
- F. Cinti et al., Phys. Rev. B 78, 020402(R) (2008).
- D. A. Olson et al., Phys. Rev. E 63, 061711 (2001).
- K. Binder and P. C. Hohenberg, Phys. Rev. B 9, 2194 (1974).
CITING ARTICLES
For access to citing articles, you need to log in.For access to citing articles, you need to Log in.
|
A new free weekly publication from APS
|
You are not logged in to this journal. Log in
| Subscription Information
View Cart
Download Citation
MyScitation
Print View