Review of Scientific Instruments
Search:
   
 
 
 
Previous Article
Doppler velocimeter for laser accelerated targets
A doppler velocimeter utilizing a spectrograph and a short-pulse laser probe is described which provides good spatial (20 µm) and subnanosecond temporal resolution. This system has been used to ...
Next Article
Application of a directly exposed self-scanning photodiode array as a linear position sensitive detector in a small-angle x-ray scattering instrument
A linear position sensitive small-angle x-ray detector has been developed which utilizes a directly exposed self-scanning photodiode array cooled to liquid nitrogen temperature to reduce fixed pattern...

Stabilizing feedback system for synchrotron radiation monochromators

Rev. Sci. Instrum. 51, 1664 (1980); doi:10.1063/1.1136146

Issue Date: December 1980

You are not logged in to this journal. Log in

D. Mills and V. Pollock
CHESS (Cornell High Energy Synchrotron Source) and the School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
We have designed and constructed a feedback system that will maintain the angle between two x-ray diffracting crystals. The system was designed for use in conjunction with a double crystal synchrotron radiation monochromator at CHESS and will preserve the relative angle between crystals during energy scans and as a function of time for a fixed wavelength. A voltage proportional to the slope of the rocking curve is used as the feedback signal. This signal is normalized in such a way that the time dependence of the incident beam intensity is removed. The feedback system allows one to sit not only at the peak of the rocking curve, but also on the flanks, an aspect crucial when utilizing the harmonic rejection properties of the double crystal monochromator. Review of Scientific Instruments is copyrighted by The American Institute of Physics.
BUY THIS ARTICLE   (US$24)
Download PDF (395 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 07.85.+n
    Specific instrumentation and techniques of general use in physics X- and -ray instruments and techniques
  • YEAR: 1980

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (5)

For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. J. H. Beaumont and M. Hart, J. Phys. E, 7, 823 (1974).
  2. U. Bonse, G. Materlik, and W. Schröder, J. Appl. Crystallogr. 9, 223 (1976).
  3. R. W. James, The Optical Principles of the Diffraction of X-Rays (Cornell University Press, Ithaca, NY, 1965), p. 65.
  4. L. J. van Mellaert and G. H. Schwuttke, Phys. Status Solidi A 3, 687 (1970).
  5. B. K. Tanner, X-Ray Diffraction Topography (Pergamon, New York, 1976), p. 34.

CITING ARTICLES

For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.