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Pressure profiles at multimegabar pressures in a diamond anvil cell using x-ray diffraction

Rev. Sci. Instrum. 59, 318 (1988); doi:10.1063/1.1140248

Issue Date: February 1988

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Keith E. Brister, Yogesh K. Vohra, and Arthur L. Ruoff
Department of Materials Science, Cornell University, Ithaca, New York 14853
Pressure distributions in a diamond anvil cell with a rhenium gasket have been measured at various pressures up to 212±6 GPa using energy dispersive x-ray diffraction with a synchrotron source. Three sets of type IA yellow diamonds were used with bevels of 5°, 7°, and 10°. For the 7°-beveled tips, a 5-µm-diam collimated beam was used to a pressure of 206±6 GPa. In the other experiments, collimators of 10–30 µm were used. In the region of the 50-µm central flat, the pressure was essentially uniform. The effect of finite collimator size on the measurement of pressure profiles is also analyzed. Review of Scientific Instruments is copyrighted by The American Institute of Physics.
History: Received 8 September 1987; accepted 25 October 1987
Permalink: http://link.aip.org/link/?RSINAK/59/318/1
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KEYWORDS and PACS

Keywords
PACS
  • 07.35.+k
    Specific instrumentation and techniques of general use in physics High-pressure production and techniques
  • 61.10.Lx
    Structure of liquids and solids; crystallography X-ray determination of structures Small-angle scattering, EDXD, EXAFS, and other techniques
  • 62.50.+p
    Mechanical, acoustical, and rheological properties of condensed matter High-pressure and shock-wave effects in solids
  • YEAR: 1988

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ISSN:
0034-6748 (print)   1089-7623 (online)
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