Resolution and signal-to-background enhancement in gas-phase electron spectroscopy
The most important factors contributing to line broadening and background intensity in electron spectra are identified and new design principles for high quality measurements are presented. It is show...
The most important factors contributing to line broadening and background intensity in electron spectra are identified and new design principles for high quality measurements are presented. It is show...
Properties of fixed-position Bragg diffractors for parallel detection of x-ray spectra
Advantages of wavelength-dispersive spectrometers over energy-dispersive spectrometers for parallel detection of x rays are discussed and factors involved in the design of wavelength-dispersive spectr...
Advantages of wavelength-dispersive spectrometers over energy-dispersive spectrometers for parallel detection of x rays are discussed and factors involved in the design of wavelength-dispersive spectr...
Optimization of hemispherical electrostatic analyzer manufacturing with respect to resolution requirements
Rev. Sci. Instrum. 64, 2190 (1993); doi:10.1063/1.1143958
Issue Date: August 1993
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Electrostatic analyzers with different geometries have been used extensively in space plasma investigations. When the energy resolution requirements are such that 
E/E![[approximately-equal-to]](http://scitation.aip.org/stockgif3/ape.gif)
10% the instrument is rather simple to design and to manufacture. However, when an energy resolution of 1% is required, the manufacturing costs increase rapidly. For analyzers with an energy resolution of 10% the calibration can also be used to correct for manufacturing errors when they appear. In this paper, it has been shown that to reach an energy resolution E/E=(1.6±0.2)% using a hemispherical electrostatic analyzer with outer and inner radii 101.25 and 98.75 mm respectively and plate thickness 0.4 mm, an accuracy of 25 µm in the alignment of one hemisphere with respect to the other is sufficient. It is also shown that the effect on the energy resolution of an indentation of the surface of one of the conductors can be neglected as long as its depth is less than 100 µm. Larger indentations can easily be detected in the manufacturing process. For each case considered, the maximum permitted loss of transmitted particles with respect to the transmission of an ideal instrument has been defined as 10%. Similarly, it has been specified that the deviations in the distributions of entrance angles of transmitted particles shall be less than 0.1°.
Review of Scientific Instruments is copyrighted by The American Institute of Physics.
E/E10% the instrument is rather simple to design and to manufacture. However, when an energy resolution of 1% is required, the manufacturing costs increase rapidly. For analyzers with an energy resolution of 10% the calibration can also be used to correct for manufacturing errors when they appear. In this paper, it has been shown that to reach an energy resolution E/E=(1.6±0.2)% using a hemispherical electrostatic analyzer with outer and inner radii 101.25 and 98.75 mm respectively and plate thickness 0.4 mm, an accuracy of 25 µm in the alignment of one hemisphere with respect to the other is sufficient. It is also shown that the effect on the energy resolution of an indentation of the surface of one of the conductors can be neglected as long as its depth is less than 100 µm. Larger indentations can easily be detected in the manufacturing process. For each case considered, the maximum permitted loss of transmitted particles with respect to the transmission of an ideal instrument has been defined as 10%. Similarly, it has been specified that the deviations in the distributions of entrance angles of transmitted particles shall be less than 0.1°.
Review of Scientific Instruments is copyrighted by The American Institute of Physics.
| History: | Received 7 December 1992; accepted 23 April 1993 |
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http://link.aip.org/link/?RSINAK/64/2190/1 |
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KEYWORDS and PACS
ELECTROSTATIC ANALYZERS,
ENERGY RESOLUTION,
PLASMA DIAGNOSTICS,
MANUFACTURING,
COST ESTIMATION,
OPTIMIZATION,
SPACE VEHICLE COMPONENTS
- 95.55.Pe
Fundamental astronomy and astrophysics; instrumentation, techniques, and astronomical observations Astronomical and space-research instrumentation Lunar, planetary, and deep-space probes - 52.70.Nc
The physics of plasmas and electric discharges Plasma diagnostic techniques and instrumentation Particle measurements - YEAR: 1993
RELATED DATABASES
PUBLICATION DATA
0034-6748 (print)
1089-7623 (online)
AIP
REFERENCES (8)
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- M. R. Spiegel, Theory and Problems of Vector Analysis and an Introduction to Tensor Analysis (McGraw-Hill, New York, 1959).
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- J. T. Gosling, M. F. Thomson, and R. C. Anderson, A Cookbook for Determining Essential Transmission Characteristics of Spherical Section Electrostatic Analyzers, Los Alamos National Laboratory, Los Alamos, NM 87545, 1984.
