Review of Scientific Instruments
Feedback | Help | Exit
Review of Scientific Instruments
   
 
 
 
Previous Article
Measurement of low energy ion tracks in CR-39 plastic with an atomic force microscope
We demonstrate that an atomic force microscope allows one to measure the detailed geometry of etch pits due to heavy ions with kinetic energies of 1−10 keV/amu at small distance scales registere...
Next Article
Charged nanocantilever as a generator of microscopic ac fields
An application of an electrically charged nanosize mechanical oscillator for generating strong ac electromagnetic fields, limited to a microscopically small volume, is indicated. The study by this met...

Parallel beam approximation for V-shaped atomic force microscope cantilevers

Rev. Sci. Instrum. 66, 4583 (1995); doi:10.1063/1.1145292

Issue Date: September 1995

You are not logged in to this journal. Log in

John Elie Sader
Department of Mathematics, University of Melbourne, Parkville, 3052 Victoria, Australia
Due to its simplicity, the parallel beam approximation (PBA) is commonly used in the analytical evaluation of the spring constant of V-shaped atomic force microscope (AFM) cantilevers. However, the point of contention regarding the validity of the PBA is as yet an unresolved issue, which has been exacerbated by some recent contradictory reports. In this paper, we present a detailed investigation of the deflection properties of the V-shaped AFM cantilever, and in so doing, show that the PBA is in fact a valid and accurate approximation, provided the width and length of the parallel rectangular arms are chosen appropriately. As a direct consequence of this finding, we obtain exceedingly simple yet accurate formulas for the V-shaped cantilever, which will be of value to the users of the AFM. ©1995 American Institute of Physics.
History: Received 17 April 1995; accepted 6 June 1995
Permalink: http://link.aip.org/link/?RSINAK/66/4583/1
BUY THIS ARTICLE   (US$28)
Download PDF (609 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 07.79.Lh
    Instruments, apparatus, components, and techniques common to several branches of physics and astronomy Scanning probe microscopes, components, and techniques Atomic force microscopes
  • YEAR: 1995

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (10)
View in Separate Window/Tab
For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. J. M. Neumeister and W. A. Ducker, Rev. Sci. Instrum. 65, 2527 (1994).
  2. T. R. Albrecht, S. Akamine, T. E. Carver, and C. F. Quate, J. Vac. Sci. Technol. A 8, 3386 (1990).
  3. S. Timoshenko, Strength of Materials (Krieger, Malabar, FL, 1984).
  4. J. E. Sader and L. R. White, J. Appl. Phys. 74, 1 (1993).
  5. H.-J. Butt, P. Siedle, K. Seifert, K. Fendler, T. Seeger, E. Bamberg, A. L. Weisenhorn, K. Goldie, and A. Engel, J. Microsc. 169, 75 (1993).
  6. J. E. Sader, I. Larson, P. Mulvaney, and L. R. White, Rev. Sci. Instrum. 66, 3789 (1995).
  7. L. D. Landau and E. M. Lifshitz, Theory of Elasticity (Pergamon, Oxford, 1970).
  8. E. H. Mansfield, The Bending and Stretching of Plates (Pergamon, Oxford, 1964).
  9. PAFEC is a trademark of, and is available from, PAFEC Ltd, Strelley Hall, Main Street, Strelley, Nottingham NG8 6PE, England.
  10. P. Mulvaney (personal communication).

CITING ARTICLES
For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.


Copyright © American Institute of Physics