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A computer-controlled apparatus for performing pressure–composition–temperature measurements on metal hydrides with protium, deuterium, and tritium
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Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for scanning electron microscope applications
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Inelastic electron tunneling spectroscopy measurements using adjustable oxide-free tunnel junctions

Rev. Sci. Instrum. 72, 1781 (2001); doi:10.1063/1.1347382

Issue Date: March 2001

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Darin T. Zimmerman
Department of Physics, Penn State Altoona, Altoona, Pennsylvania 16601-3760

Glenn Agnolet
Department of Physics, Texas A&M University, College Station, Texas 77843-4242
We report an adjustable, oxide-free tunnel junction for inelastic electron tunneling spectroscopy that is capable of detecting the vibrational modes of molecules adsorbed on clean metal surfaces. In this article, we describe the details of these junctions and the procedure by which the tunneling data is obtained and analyzed. We also describe a compact 4He cryostat that was built to test the properties of these junctions. The performance of the junctions is demonstrated with tunneling data taken with a neon–hydrogen film adsorbed on platinum. ©2001 American Institute of Physics.
History: Received 20 October 2000; accepted 7 December 2000
Permalink: http://link.aip.org/link/?RSINAK/72/1781/1
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KEYWORDS and PACS

Keywords
PACS
  • 68.43.Pq
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Chemisorption/physisorption: adsorbates on surfaces Adsorbate vibrations
  • 73.40.Gk
    Electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures Electronic transport in interface structures Tunneling
  • 68.35.Ja
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Solid surfaces and solid-solid interfaces: Structure and energetics Surface and interface dynamics and vibrations
  • YEAR: 2001

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ISSN:
0034-6748 (print)   1089-7623 (online)
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