Two linear beetle-type scanning tunneling microscopes
Two beetle-type scanning tunneling microscopes are described. Both designs have the thermal stability of the Besocke beetle and the simplicity of the Wilms beetle. Moreover, sample holders were design...
Two beetle-type scanning tunneling microscopes are described. Both designs have the thermal stability of the Besocke beetle and the simplicity of the Wilms beetle. Moreover, sample holders were design...
In situ scanning tunneling microscopy of individual supported metal clusters at reactive gas pressures from 10–8 to 104 Pa
An experimental apparatus has been designed and an approach developed for imaging individual oxide supported nanoparticles with scanning tunneling microscopy (STM) during their nucleation, growth, all...
An experimental apparatus has been designed and an approach developed for imaging individual oxide supported nanoparticles with scanning tunneling microscopy (STM) during their nucleation, growth, all...
Susceptibility of atomic force microscope cantilevers to lateral forces
Rev. Sci. Instrum. 74, 2438 (2003); doi:10.1063/1.1544421
Issue Date: April 2003
You are not logged in to this journal. Log in
V-shaped cantilevers are used widely in the atomic force microscope (AFM) due to their perceived enhanced resistance to lateral forces in comparison to rectangular cantilevers. In this article, we rigorously investigate this premise, and in so doing establish that, contrary to established operating principles and intuition, V-shaped AFM cantilevers are generally more prone to the effects of lateral forces than rectangular AFM cantilevers. This finding suggests that rectangular cantilevers should be used in place of V-shaped cantilevers in applications where the effects of lateral forces are to be minimized. ©2003 American Institute of Physics.
| History: | Received 13 August 2002; accepted 10 December 2002 |
| Permalink: |
http://link.aip.org/link/?RSINAK/74/2438/1 |
Connotea
CiteULike
del.icio.us
BibSonomy
REFERENCES (11)
For access to fully linked references, you need to log in.
For access to fully linked references, you need to Log in.
- G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
- G. Binnig, Ch. Gerber, E. Stoll, T. R. Albrecht, and C. F. Quate,
Europhys. Lett. 3, 1281 (1987) . - T. R. Albrecht and C. F. Quate, J. Appl. Phys. 62, 2599 (1987).
- T. R. Albrecht, S. Akamine, T. E. Carver, and C. F. Quate,
J. Vac. Sci. Technol. A 8, 3386 (1990) . - D. Sarid, Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford University Press, New York, 1994).
- R. J. Roark and W. C. Young, Formulas for Stress and Strain (McGraw-Hill, New York, 1975).
- J. M. Neumeister and W. A. Ducker, Rev. Sci. Instrum. 65, 2527 (1994).
- J. E. Sader, Rev. Sci. Instrum. 66, 4583 (1995).
- The accuracy of Eq. (2) for rectangular cantilevers was assessed using finite element analysis (LUSAS is a trademark of, and is available from, FEA Ltd., Forge House, 66 High Street, Kingston Upon Thames, Surrey, KT1 1HN, U.K.). The effect of the imaging tip was simulated by ensuring the cantilever was rigid for x
(L–
L). For the typical case of 
= 0.25, and (L–L)/c1, we find that kz, k
, kz
, and k exhibit maximum errors of 5%, 1%, 4%, and 4%, respectively. The accuracy of all formulas improve as (L–L)/c increases, and are exact in the limit as (L–L)/c
![[infinity]](http://scitation.aip.org/stockgif2/infin.gif)
. The accuracy of Eq. (3) for V-shaped cantilevers was examined in Refs. 7 and 8. - E. Reissner and M. Stein, N.A.C.A. Technical Note No. 2369, June (1951).
- J. E. Sader, in Encyclopedia of Surface and Colloid Science, edited by A. Hubbard (Marcel Dekker, New York, 2002), pp. 846–856.
