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Fizeau interferometer for measurement of plasma electron current

Rev. Sci. Instrum. 75, 3399 (2004); doi:10.1063/1.1780771

Published 1 October 2004

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D. L. Brower, W. X. Ding, and B. H. Deng
Electrical Engineering Department, University of California, Los Angeles, Los Angeles, California 90095

M. A. Mahdavi
General Atomics, San Diego, California 92121

V. Mirnov and S. C. Prager
Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706
A high-resolution, vertically viewing far-infrared polarimeter-interferometer system is currently used on the Madison symmetric torus (MST) reversed-field pinch (RFP) to measure the plasma electron density and toroidal current density via Faraday rotation. In this article, we propose a scheme to measure the well-known Fizeau effect, whereby through modest modification of the existing apparatus, the line-integrated poloidal current density can also be directly measured. This parameter is important, since the RFP toroidal magnetic field is largely determined by currents flowing within the plasma. The Fizeau effect is a phase shift of an electromagnetic wave associated with movement of a dielectric medium. This motion can be related directly to the plasma electron current. Determining the Fizeau effect involves measurement of the phase shift between two collinear, orthogonally polarized, counterpropagating laser beams. Estimates indicate a phase shift of ~2° is expected for typical MST parameters, well within the existing system resolution. ©2004 American Institute of Physics
History: Presented 19 April 2004; published 1 October 2004
Permalink: http://link.aip.org/link/?RSINAK/75/3399/1
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KEYWORDS and PACS

Keywords
PACS
  • 07.60.Ly
    Optical interferometers
  • 52.25.Fi
    Plasma transport properties
  • 07.55.Ge
    Magnetometers for magnetic field measurements
  • 52.70.Kz
    Optical (ultraviolet, visible, infrared) plasma diagnostic measurements
  • YEAR: 2004

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PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
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REFERENCES (6)

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  1. D. L. Brower et al., Rev. Sci. Instrum. 74, 1534 (2003).
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  3. Ch. Fuchs and H. J. Hartfuss, Phys. Rev. Lett. 81, 1626 (1998).
  4. H. Fizeau, Ann. Chim. Phys. (3)57, 385 (1859).
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  6. W. X. Ding et al., Phys. Rev. Lett. 90, 035002 (2003).

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