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Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe

Rev. Sci. Instrum. 76, 113701 (2005); doi:10.1063/1.2125730

Published 7 November 2005

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Wenjun Liu
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 and University of Illinois at Urbana-Champaign, Urbana, Illinois 61801

Gene E. Ice and Jonathan Z. Tischler
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831

Ali Khounsary, Chian Liu, Lahsen Assoufid, and Albert T. Macrander
Argonne National Laboratory, Argonne, Illinois 60439
We describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors. The short focal length optics produce nanoscale beams (<100  nm) on conventional (~64  m long) beamlines at third generation synchrotron sources. The total-external reflection optics are inherently achromatic and efficiently focus a white (polychromatic) or a tunable monochromatic spectrum of x rays. The ability to focus independent of wavelength allows novel new experimental capabilities. Mirrors have been fabricated both by computer assisted profiling (differential polishing) and by profile coating (coating through a mask onto ultra-smooth surfaces). A doubly focused 85×95  nm2 hard x-ray nanobeam has been obtained on the UNICAT beamline 34-ID at the Advanced Photon Source. The performance of the mirrors, techniques for characterizing the spot size, and factors limiting focusing performance are discussed. ©2005 American Institute of Physics
History: Received 10 August 2005; accepted 19 September 2005; published 7 November 2005
Permalink: http://link.aip.org/link/?RSINAK/76/113701/1
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KEYWORDS and PACS

Keywords
PACS
  • 07.85.Fv
    X- and gamma-ray sources, mirrors, gratings, and detectors
  • 41.50.+h
    X-ray beams and X-ray optics
  • 07.85.Qe
    Synchrotron radiation instrumentation
  • YEAR: 2005

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PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
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