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A hot-wire probe for thermal measurements of nanowires and nanotubes inside a transmission electron microscope

Rev. Sci. Instrum. 78, 104903 (2007); doi:10.1063/1.2785848

Published 11 October 2007

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C. Dames
Department of Mechanical Engineering, University of California at Riverside, California 92521, USA

S. Chen
Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

C. T. Harris
Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA and Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1415, USA

J. Y. Huang
Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1415, USA

Z. F. Ren
Department of Physics, Boston College, Chestnut Hill, Massachusetts 02467, USA

M. S. Dresselhaus
Department of Physics and Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

G. Chen
Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
A hot wire probe has been developed for use inside a transmission electron microscope to measure the thermal resistance of individual nanowires, nanotubes, and their contacts. No microfabrication is involved. The probe is made from a platinum Wollaston wire and is pretensioned to minimize the effects of thermal expansion, intrinsic thermal vibrations, and Lorentz forces. An in situ nanomanipulator is used to select a particular nanowire or nanotube for measurement, and contacts are made with liquid metal droplets or by electron-beam induced deposition. Detailed thermal analysis shows that for best sensitivity, the thermal resistance of the hot-wire probe should be four times that of the sample, but a mismatch of more than two orders of magnitude may be acceptable. Data analysis using the ratio of two ac signals reduces the experimental uncertainty. The range of detectable sample thermal resistances spans from approximately 103  to  109  K/W. The probe can also be adapted for measurements of the electrical conductance and Seebeck coefficient of the same sample. The probe was used to study a multiwalled carbon nanotube with liquid Ga contacts. The measured thermal resistance of 3.3×107  K/W had a noise level of approximately ±3% and was repeatable to within ±10% upon breaking and re-making the contact. ©2007 American Institute of Physics
History: Received 23 July 2007; accepted 9 August 2007; published 11 October 2007
Permalink: http://link.aip.org/link/?RSINAK/78/104903/1
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KEYWORDS and PACS

Keywords
PACS
  • 65.40.De
    Thermal expansion; thermomechanical effects (crystalline solids)
  • 65.80.+n
    Thermal properties of small particles, nanocrystals, and nanotubes
  • 61.46.Fg
    Nanotubes
  • 73.61.Wp
    Electrical properties of fullerenes and related materials (thin films)
  • 68.65.-k
    Low-dimensional, mesoscopic, and nanoscale systems: structure and nonelectronic properties
  • YEAR: 2007

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PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
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