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A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research

Rev. Sci. Instrum. 78, 123701 (2007); doi:10.1063/1.2821610

Published 10 December 2007 | See: Publisher's Note

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Tae-Hwan Kim
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

Zhouhang Wang
RHK Technology, Inc., Troy, Michigan 48083, USA

John F. Wendelken
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

Hanno H. Weitering
Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996, USA

Wenzhi Li
Department of Physics, Florida International University, Miami, Florida 33199, USA

An-Ping Li
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
We describe the development and the capabilities of an advanced system for nanoscale electrical transport studies. This system consists of a low temperature four-probe scanning tunneling microscope (STM) and a high-resolution scanning electron microscope coupled to a molecular-beam epitaxy sample preparation chamber. The four STM probes can be manipulated independently with subnanometer precision, enabling atomic resolution STM imaging and four-point electrical transport study of surface electronic systems and nanostructured materials at temperatures down to 10  K. Additionally, an integrated energy analyzer allows for scanning Auger microscopy to probe chemical species of nanostructures. Some testing results are presented. ©2007 American Institute of Physics
History: Received 6 June 2007; accepted 15 November 2007; published 10 December 2007; publisher error corrected 5 February 2008
Permalink: http://link.aip.org/link/?RSINAK/78/123701/1
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ERRATUM

  1. Publisher's Note: “A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research” [Rev. Sci. Instrum. 78, 123701 (2007)]
    Tae-Hwan Kim et al.
    Rev. Sci. Instrum. 79, 029902 (2008)

KEYWORDS and PACS

Keywords
PACS
  • 73.63.-b
    Electronic transport in nanoscale materials and structures
  • 07.79.Cz
    Scanning tunneling microscopes
  • 07.78.+s
    Electron, positron, and ion microscopes; electron diffractometers
  • 61.46.-w
    Nanoscale materials
  • YEAR: 2007

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PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
Publisher:
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REFERENCES (15)
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