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A short working distance multiple crystal x-ray spectrometer

Rev. Sci. Instrum. 79, 123112 (2008); doi:10.1063/1.3048544

Published 23 December 2008

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B. Dickinson,1 G. T. Seidler,1 Z. W. Webb,1 J. A. Bradley,1 K. P. Nagle,1 S. M. Heald,2 R. A. Gordon,3 and I. M. Chou4
1Department of Physics, University of Washington, Seattle, Washington 98195, USA
2Advanced Photon Source, Argonne National Laboratories, Argonne, Illinois 60439, USA
3Department of Physics, Simon Fraser University, Burnaby, British Columbia V5A 1S6, Canada
4U.S. Geological Survey, Reston, Virginia 20192, USA
For x-ray spot sizes of a few tens of microns or smaller, a millimeter-sized flat analyzer crystal placed ~1  cm from the sample will exhibit high energy resolution while subtending a collection solid angle comparable to that of a typical spherically bent crystal analyzer (SBCA) at much larger working distances. Based on this observation and a nonfocusing geometry for the analyzer optic, we have constructed and tested a short working distance (SWD) multicrystal x-ray spectrometer. This prototype instrument has a maximum effective collection solid angle of 0.14 sr, comparable to that of 17 SBCA at 1 m working distance. We find good agreement with prior work for measurements of the Mn Kbeta x-ray emission and resonant inelastic x-ray scattering for MnO, and also for measurements of the x-ray absorption near-edge structure for Dy metal using Lalpha2 partial-fluorescence yield detection. We discuss future applications at third- and fourth-generation light sources. For concentrated samples, the extremely large collection angle of SWD spectrometers will permit collection of high-resolution x-ray emission spectra with a single pulse of the Linac Coherent Light Source. The range of applications of SWD spectrometers and traditional multi-SBCA instruments has some overlap, but also is significantly complementary. ©2008 American Institute of Physics
History: Received 19 September 2008; accepted 24 November 2008; published 23 December 2008
Permalink: http://link.aip.org/link/?RSINAK/79/123112/1
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KEYWORDS and PACS

Keywords
PACS
  • 07.85.Nc
    X-ray and γ-ray spectrometers
  • 82.80.Ej
    X-ray, Mössbauer, and other γ-ray spectroscopic chemical analysis methods
  • 78.70.Dm
    X-ray absorption spectra (condensed matter)
  • 61.05.cj
    X-ray absorption spectroscopy (condensed matter structure determination)
  • 78.70.En
    X-ray emission spectra and fluorescence (condensed matter)
  • YEAR: 2008

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PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
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AIP is a member of CrossRef AIP

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