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Cryogenic ion trapping systems with surface-electrode traps

Rev. Sci. Instrum. 80, 013103 (2009); doi:10.1063/1.3058605

Published 7 January 2009

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P. B. Antohi,1 D. Schuster,2 G. M. Akselrod,1 J. Labaziewicz,1 Y. Ge,1 Z. Lin,1 W. S. Bakr,3 and I. L. Chuang1
1Department of Physics, Center for Ultracold Atoms, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
2Department of Applied Physics, Yale University, New Haven, Connecticut 06511, USA
3Department of Physics, Center for Ultracold Atoms, Harvard University, Cambridge, Massachusetts 02138, USA

We present two simple cryogenic rf ion trap systems in which cryogenic temperatures and ultra high vacuum pressures can be reached in as little as 12 h. The ion traps are operated either in a liquid helium bath cryostat or in a low vibration closed cycle cryostat. The fast turn around time and availability of buffer gas cooling made the systems ideal for testing surface-electrode ion traps. The vibration amplitude of the closed cycled cryostat was found to be below 106 nm. We evaluated the systems by loading surface-electrode ion traps with 88Sr+ ions using laser ablation, which is compatible with the cryogenic environment. Using Doppler cooling we observed small ion crystals in which optically resolved ions have a trapped lifetime over 2500 min. ©2009 American Institute of Physics
History: Received 30 July 2008; accepted 6 December 2008; published 7 January 2009
Permalink: http://link.aip.org/link/?RSINAK/80/013103/1
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KEYWORDS and PACS

Keywords
PACS
  • 37.10.Ty
    Ion trapping
  • 37.10.Rs
    Ion cooling
  • 07.20.Mc
    Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment
  • YEAR: 2009

PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (44)

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  1. G. Gabrielse, D. Phillips, W. Quint, H. Kalinowsky, G. Rouleau, and W. Jhe, Phys. Rev. Lett. 74, 3544 (1995).
  2. L. Deslauriers, S. Olmschenk, D. Stick, W. K. Hensinger, J. Sterk, and C. Monroe, Phys. Rev. Lett. 97, 103007 (2006).
  3. F. Diedrich, J. C. Bergquist, W. M. Itano, and D. J. Wineland, Phys. Rev. Lett. 62, 403 (1989).
  4. L. Deslauriers, P. C. Haijan, P. J. Lee, K. A. Brickman, B. B. Blinov, M. J. Madsen, and C. Monroe, Phys. Rev. A 70, 043408 (2004).
  5. C. Roos, T. Zeiger, H. Rohde, H. C. Nägerl, J. Eschner, D. Leibfried, F. Schmidt-Kaler, and R. Blatt, Phys. Rev. Lett. 83, 4713 (1999).
  6. Q. A. Turchette, D. Kielpinski, B. E. King, D. Leibfried, D. M. Meekhof, C. J. Myatt, M. A. Rowe, C. A. Sackett, C. S. Wood, W. M. Itano, C. Monroe, and D. J. Wineland, Phys. Rev. A 61, 063418 (2000).
  7. J. Labaziewicz, Y. Ge, P. Antohi, D. Leibrandt, K. R. Brown, and I. L. Chuang, Phys. Rev. Lett. 100, 013001 (2008).
  8. D. Leibrandt, B. Yurke, and R. Slusher, Quantum Inf. Comput. 7, 52 (2007).
  9. V. H. S. Kwong, J. Phys. (Paris) 50, 413 (1989).
  10. C. G. Gill, A. W. Garrett, N. S. Nogar, and P. H. Hemberger, Rapid Commun. Mass Spectrom. 11, 551 (1997).
  11. R. deCarvalho, N. Brahms, B. Newman, J. M. Doyle, D. Kleppner, and T. Greytak, Can. J. Phys. 83, 293 (2005).
  12. Y. Hashimoto, L. Matsuoka, H. Osaki, Y. Fukushima, and S. Hasegawa, Jpn. J. Appl. Phys., Part 1 45, 7108 (2006).
  13. S. Kitazawa, K. Okada, T. Nakamura, S. Ohtani, and H. Takuma, Jpn. J. Appl. Phys., Part 1 32, 5147 (1993).
  14. D. Kielpinski, C. Monroe, and D. J. Wineland, Nature (London) 417, 709 (2002).
  15. T. Schaetz, D. Leibfried, J. Chiaverini, M. D. Barrett, J. Britton, B. DeMarco, W. M. Itano, J. D. Jost, C. Langer, and D. J. Wineland, Appl. Phys. B: Lasers Opt. 79, 979 (2004).
  16. J. Chiaverini, R. B. Blakestad, J. Britton, J. D. Jost, C. Langer, D. Leibfried, R. Ozeri, and D. J. Wineland, Quantum Inf. Comput. 5, 419 (2005).
  17. C. E. Pearson, D. R. Leibrandt, W. S. Bakr, W. J. Mallard, K. R. Brown, and I. L. Chuang, Phys. Rev. A 73, 032307 (2006).
  18. S. Seidelin, J. Chiaverini, R. Reichle, J. J. Bollinger, D. Leibfried, J. Britton, J. H. Wesenberg, R. B. Blakestad, R. J. Epstein, D. B. Hume, W. M. Itano, J. D. Jost, C. Langer, R. Ozeri, N. Shiga, and D. J. Wineland, Phys. Rev. Lett. 96, 253003 (2006).
  19. L. Tian, P. Rabl, R. Blatt, and P. Zoller, Phys. Rev. Lett. 92, 247902 (2004).
  20. J. I. Cirac and P. Zoller, Phys. Rev. Lett. 74, 4091 (1995).
  21. D. J. Wineland, C. Monroe, W. M. Itano, D. Leibfried, B. E. King, and D. M. Meekhof, J. Res. Natl. Inst. Stand. Technol. 103, 259 (1998).
  22. D. F. V. James, Appl. Phys. B: Lasers Opt. 66, 181 (1998).
  23. M. E. Poitzsch, J. C. Bergquist, W. M. Itano, and D. J. Wineland, Rev. Sci. Instrum. 67, 129 (1996).
  24. K. Okada, M. Wada, T. Nakamura, I. Katayama, L. Boesten, and S. Ohtani, Jpn. J. Appl. Phys., Part 1 40, 4221 (2001).
  25. P. A. Willems and K. G. Libbrecht, Phys. Rev. A 51, 1403 (1995).
  26. T. Nirrengarten, A. Qarry, C. Roux, A. Emmert, G. Nogues, M. Brune, J. M. Raimond, and S. Haroche, Phys. Rev. Lett. 97, 200405 (2006).
  27. D. J. Berkeland, Rev. Sci. Instrum. 73, 2856 (2002).
  28. R. J. Deri, Rev. Sci. Instrum. 57, 82 (1986).
  29. R. Diehl, D. M. Wheatley, and T. G. Castner, Rev. Sci. Instrum. 67, 3904 (1996).
  30. A. E. R. Centeno, P. S. Excell, T. W. Button, and N. M. Alford, IEEE Trans. Appl. Supercond. 5, 19 (1995).
  31. M. J. Lancaster, T. S. M. Maclean, Z. Wu, A. Porch, P. Woodall, and N. N. Alford, IEE Proc., Part H: Microwaves, Antennas Propag. 139, 149 (1992).
  32. L. Frunzio, A. Wallraff, D. Schuster, J. Majer, and R. Schoelkopf, IEEE Trans. Appl. Supercond. 15, 860 (2005).
  33. J. Labaziewicz, P. Richerme, K. R. Brown, I. L. Chuang, and K. Hayasaka, Opt. Lett. 32, 572 (2007).
  34. S. Mannervik, J. Lidberg, L. O. Norlin, P. Royen, A. Schmitt, W. Shi, and X. Tordoir, Phys. Rev. Lett. 83, 698 (1999).
  35. D. R. Leibrandt, R. J. Clark, J. Labaziewicz, P. Antohi, W. Bakr, K. R. Brown, and I. L. Chuang, Phys. Rev. A 76, 055403 (2007).
  36. R. A. Haefer, J. Phys. E 14, 273 (1981).
  37. B. Roth, P. Blythe, H. Wenz, H. Daerr, and S. Schiller, Phys. Rev. A 73, 042712 (2006).
  38. K. Sugiyama and J. Yoda, Phys. Rev. A 55, R10 (1997).
  39. Practical Aspects of Ion Trap Mass Spectrometry, edited by R. E. March and J. F. J. Todd (CRC, Boca Raton, 1995), Vol. I.
  40. NIST Chemistry WebBook, NIST Standard Reference Database, 2005.
  41. CRC Handbook of Chemistry and Physics, 88th ed., edited by D. R. Lide (CRC, Boca Raton, 2007).
  42. Y. Moriwaki, M. Tachikawa, Y. Maeno, and T. Shimizu, Jpn. J. Appl. Phys., Part 2 31, L1640 (1992).
  43. Y. Moriwaki, M. Tachikawa, and T. Shimizu, Jpn. J. Appl. Phys., Part 1 35, 757 (1996).
  44. Y. Moriwaki and T. Shimizu, Jpn. J. Appl. Phys., Part 1 37, 344 (1998).

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