Review of Scientific Instruments
Search:
   
 
 
 
Previous Article
Original use of a direct injection high efficiency nebulizer for the standardization of liquid fuels spray flames
It is of practical importance to lead laboratory-scale experiments allowing a better understanding of the impact of commercial fuels composition on the formation of combustion residues such as soot pa...
Next Article
Efficient, high rep rate, large-bore kinetically enhanced copper vapor laser with low (<1  kW/l) specific input power using new thermal assembly
Large-bore kinetically enhanced copper vapor laser (CVL) based on new thermal assembly consisting of different density zones of insulation material (alumina fiber) around the discharge tube is demonst...

Obtaining the dielectric constant of solids from capacitance measurements with a pointer electrode

Rev. Sci. Instrum. 80, 106101 (2009); doi:10.1063/1.3239406

Published 9 October 2009

You are not logged in to this journal. Log in

A. Guadarrama-Santana and A. García-Valenzuela
Centro de Ciencias Aplicadas y Desarrollo Tecnológico, Universidad Nacional Autónoma de México, Apartado Postal 70-186, 04510 México Distrito Federal, Mexico
We analyze the determination of the dielectric constant of macroscopic solid samples in a nondestructive way from measurements of the capacitance between a pointer electrode and the sample's surface. We assembled an experimental device and found that an accuracy of 1% or better can be attained with common laboratory instrumentation. ©2009 American Institute of Physics
History: Received 7 August 2009; accepted 8 September 2009; published 9 October 2009
Permalink: http://link.aip.org/link/?RSINAK/80/106101/1
BUY THIS ARTICLE   (US$24)
Download PDF (270 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 84.37.+q
    Electric variable measurements
  • 77.22.Ch
    Permittivity (dielectric function)
  • 07.50.-e
    Electrical and electronic instruments and components
  • YEAR: 2009

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (12)

For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. C. Cooke and J. E. Ford, J. Phys. E 14, 1285 (1981).
  2. R. -j. Zhang, S. -g. Dai, and P. -a. Mu, Meas. Sci. Technol. 8, 1028 (1997).
  3. C. C. Williams, W. P. Hough, and S. A. Rishton, Appl. Phys. Lett. 55, 203 (1989).
  4. K. Goto and K. Hane, J. Appl. Phys. 84, 4043 (1998).
  5. Š. Lányi, Surf. Interface Anal. 27, 348 (1999).
  6. S. Gómez-Moñivas, J. J. Sáenz, R. Carminati, and J. J. Greffet, Appl. Phys. Lett. 76, 2955 (2000).
  7. K. Kobayashi, H. Yamada, and K. Matsushige, Appl. Phys. Lett. 81, 2629 (2002).
  8. D. T. Lee, J. P. Pelz, and B. Bhushan, Rev. Sci. Instrum. 73, 3525 (2002).
  9. D. T. Lee, J. P. Pelz, and B. Bhushan, Nanotechnology 17, 1484 (2006).
  10. I. Casuso, L. Fumagalli, E. Padrós, and G. Gomila, Appl. Phys. Lett. 91, 063111 (2007).
  11. L. Fumagalli, G. Ferrari, M. Sampietro, and G. Gomila, Appl. Phys. Lett. 91, 243110 (2007).
  12. G. Gomila, J. Toset, and L. Fumagalli, J. Appl. Phys. 104, 024315 (2008).

CITING ARTICLES

For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.