Obtaining the dielectric constant of solids from capacitance measurements with a pointer electrode
Rev. Sci. Instrum. 80, 106101 (2009); doi:10.1063/1.3239406
Published 9 October 2009
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We analyze the determination of the dielectric constant of macroscopic solid samples in a nondestructive way from measurements of the capacitance between a pointer electrode and the sample's surface. We assembled an experimental device and found that an accuracy of 1% or better can be attained with common laboratory instrumentation.
©2009 American Institute of Physics
| History: | Received 7 August 2009; accepted 8 September 2009; published 9 October 2009 |
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http://link.aip.org/link/?RSINAK/80/106101/1 |
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