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A threshold photoelectron-photoion coincidence spectrometer with double velocity imaging using synchrotron radiation

Rev. Sci. Instrum. 80, 113101 (2009); doi:10.1063/1.3250872

Published 2 November 2009

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Xiaofeng Tang,1 Xiaoguo Zhou,1 Mingli Niu,1 Shilin Liu,1 Jinda Sun,2 Xiaobin Shan,2 Fuyi Liu,2 and Liusi Sheng2
1Hefei National Laboratory for Physical Sciences at the Microscale, Department of Chemical Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
2National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, People's Republic of China
A novel threshold photoelectron-photoion coincidence (TPEPICO) imaging spectrometer at the U14-A beamline of the Hefei National Synchrotron Radiation Laboratory is presented. A set of open electron and ion lenses are utilized to map velocity imaging of photoelectrons and photoions simultaneously, in which a repelling electric field using an extra lens is applied to magnify images of photoelectrons instead of traditional accelerating electric field in order to suppress the contribution of energetic electrons in the threshold photoelectron spectroscopy (TPES) and the mass-selected TPEPICO spectroscopy. The typical energy resolution of TPES is measured to be 9 meV (full width at half maximum), as shown on the 2P1/2 ionization of argon. The measured mass resolving power for the present TPEPICO imaging spectrometer is above 900 of M/DeltaM. Subsequently as a benchmark, oxygen molecule is photoionized by monochromatic synchrotron radiation at 20.298 eV and dissociates to an oxygen atomic ion and a neutral oxygen atom, and the translation energy distribution of oxygen atomic ion is measured by the time-sliced imaging based on mass-selected TPEPICO experiment. The kinetic energy resolution of the present ion velocity imaging is better than 3% of DeltaE/E. ©2009 American Institute of Physics
History: Received 9 August 2009; accepted 28 September 2009; published 2 November 2009
Permalink: http://link.aip.org/link/?RSINAK/80/113101/1
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KEYWORDS and PACS

Keywords
PACS
  • 07.81.+a
    Electron and ion spectrometers
  • 07.75.+h
    Mass spectrometers
  • 07.85.Nc
    X-ray and γ-ray spectrometers
  • YEAR: 2009

PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (59)
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For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. Vacuum Ultraviolet Photoionization and Photodissociation of Molecules and Clusters, edited by C. Y. Ng (World Scientific, Singapore, 1991).
  2. C. Y. Ng, in Photoionization and Photodetachment, Advanced Series in Physical Chemistry Vol. 10, edited by C. Y. Ng (World Scientific, Singapore, 1999).
  3. C. Y. Ng, Annu. Rev. Phys. Chem. 53, 101 (2002).
  4. K. M. Weitzel and J. Mähnert, Int. J. Mass Spectrom. 214, 175 (2002).
  5. T. A. Cool, A. Mcllroy, F. Qi, P. R. Westmoreland, L. Poisson, D. S. Peterka, and M. Ahmed, Rev. Sci. Instrum. 76, 094102 (2005).
  6. J. N. Shu, K. R. Wilson, M. Ahmed, and S. R. Leone, Rev. Sci. Instrum. 77, 043106 (2006).
  7. S. S. Wang, R. H. Kong, X. B. Shan, Y. W. Zhang, L. S. Sheng, Z. Y. Wang, L. Q. Hao, and S. K. Zhou, J. Synchrotron Radiat. 13, 415 (2006).
  8. C. Q. Huang, B. Yang, R. Yang, J. Wang, L. X. Wei, X. B. Shan, L. S. Sheng, Y. W. Zhang, and F. Qi, Rev. Sci. Instrum. 76, 126108 (2005).
  9. B. Brehm and E. V. Puttkamer, Z. Naturforsch. 22A, 8 (1967).
  10. J. H. D. Eland, Int. J. Mass Spectrom. Ion Phys. 12, 389 (1973).
  11. A. S. Werner and T. Baer, J. Chem. Phys. 62, 2900 (1975).
  12. R. Stockbauer, J. Chem. Phys. 58, 3800 (1973).
  13. T. Baer, in Gas Phase Ion Chemistry, edited by M. T. Bowers (Academic, New York, 1979), Vol. 1.
  14. R. Thissen, C. Alcaraz, J. Hepburn, M. Vervloet, and O. Dutuit, Int. J. Mass Spectrom. 199, 201 (2000).
  15. Q. Zha, R. N. Hayes, T. Nishimura, G. G. Meisels, and M. L. Gross, J. Phys. Chem. 94, 1286 (1990).
  16. M. Richard-Viard, O. Atabek, O. Dutuit, and P. M. Guyon, J. Chem. Phys. 93, 8881 (1990).
  17. G. K. Jarvis, K. M. Weitzel, M. Malow, T. Baer, Y. Song, and C. Y. Ng, Rev. Sci. Instrum. 70, 3892 (1999).
  18. B. Sztáray and T. Baer, Rev. Sci. Instrum. 74, 3763 (2003).
  19. D. P. Seccombe, R. Y. L. Chim, G. K. Jarvis, and R. P. Tuckett, Phys. Chem. Chem. Phys. 2, 769 (2000).
  20. T. Baer, W. B. Peatman, and E. W. Schlag, Chem. Phys. Lett. 4, 243 (1969).
  21. R. Spohr, P. M. Guyon, W. A. Chupka, and J. Berkowitz, Rev. Sci. Instrum. 42, 1872 (1971).
  22. R. I. Hall, A. McConkey, K. Ellis, G. Dawber, L. Avaldi, M. A. MacDonald, and G. C. King, Meas. Sci. Technol. 3, 316 (1992).
  23. P. A. Hatherly, M. Stankiewicz, K. Codling, J. C. Creasey, H. M. Jones, and R. P. Tuckett, Meas. Sci. Technol. 3, 891 (1992).
  24. D. M. Smith, R. P. Tuckett, K. R. Yoxall, K. Codling, P. A. Hatherly, J. F. M. Aarts, and M. Stankiewicz, J. Chem. Phys. 101, 10559 (1994).
  25. T. Baer, P. M. Guyon, I. Nenner, A. Tabché-Fouhaillé, R. Botter, L. F. A. Ferreira, and T. R. Govers, J. Chem. Phys. 70, 1585 (1979).
  26. F. Merkt, P. M. Guyon, and J. W. Hepburn, Chem. Phys. 173, 479 (1993).
  27. F. Merkt and P. M. Guyon, J. Chem. Phys. 99, 3400 (1993).
  28. K. M. Weitzel and F. Guthe, Chem. Phys. Lett. 251, 295 (1996).
  29. G. K. Jarvis, R. C. Shiell, J. W. Hepburn, Y. Song, and C. Y. Ng, Rev. Sci. Instrum. 71, 1325 (2000).
  30. X. M. Qian, K. C. Lau, G. Z. He, C. Y. Ng, and M. Hochlaf, J. Chem. Phys. 120, 8476 (2004).
  31. T. Baer and Y. Li, Int. J. Mass Spectrom. 219, 381 (2002).
  32. T. Baer, B. Sztáray, J. P. Kercher, A. F. Lago, A. Bödi, C. Skull and D. Palathinkal, Phys. Chem. Chem. Phys. 7, 1507 (2005).
  33. A. T. J. B. Eppink and D. H. Parker, Rev. Sci. Instrum. 68, 3477 (1997).
  34. D. W. Chandler and D. H. Parker, Adv. Photochem. 25, 59 (1999).
  35. J. A. Davies, J. E. LeClaire, R. E. Continetti, and C. C. Hayden, J. Chem. Phys. 111, 1 (1999).
  36. G. A. Garcia, H. Soldi-Lose, and L. Nahon, Rev. Sci. Instrum. 80, 023102 (2009).
  37. A. Bödi, M. Johnson, T. Gerber, Z. Gengeliczki, B. Sztáray, and T. Baer, Rev. Sci. Instrum. 80, 034101 (2009).
  38. R. Vasudev, R. N. Zare, and R. N. Dixon, J. Chem. Phys. 80, 4863 (1984).
  39. H. Xu, Y. Guo, Q. Li, Y. Shi, S. Liu, and X. Ma, J. Chem. Phys. 121, 3069 (2004).
  40. J. L. Wiza, Nucl. Instrum. Methods 162, 587 (1979).
  41. H. L. Offerhaus, C. Nicole, F. Lépine, C. Bordas, F. Rosca-Pruna, and M. J. J. Vrakking, Rev. Sci. Instrum. 72, 3245 (2001).
  42. A. Osterwalder, M. J. Nee, J. Zhou, and D. M. Neumark, J. Chem. Phys. 121, 6317 (2004).
  43. A. Bödi, B. Sztáray, T. Baer, M. Johnson, and T. Gerber, Rev. Sci. Instrum. 78, 084102 (2007).
  44. D. Irimia, R. Kortekaas, and M. H. M. Janssen, Phys. Chem. Chem. Phys. 11, 3958 (2009).
  45. Molecular Beams, edited by N. F. Ramsey (Oxford University Press, New York, 1985).
  46. D. H. Parker and A. T. J. B. Eppink, J. Chem. Phys. 107, 2357 (1997).
  47. B. Buijsse, W. J. van der Zande, A. T. J. B. Eppink, D. H. Parker, B. R. Lewis, and S. T. Gibson, J. Chem. Phys. 108, 7229 (1998).
  48. T. Akahori, Y. Morioka, M. Watanabe, T. Hayaishi, K. Ito, and M. Nakamura, J. Phys. B 18, 2219 (1985).
  49. M. Richard-Viard, O. Dutuit, M. Lavollée, T. Govers, P. M. Guyon, and J. Durup, J. Chem. Phys. 82, 4054 (1985).
  50. M. Evans, S. Stimson, C. Y. Ng, C. -W. Hsu, and G. K. Jarvis, J. Chem. Phys. 110, 315 (1999).
  51. K. Tonokura and T. Suzuki, Chem. Phys. Lett. 224, 1 (1994).
  52. C. R. Gebhardt, T. P. Rakitzis, P. C. Samartzis, V. Ladopoulos, and T. N. Kitsopoulos, Rev. Sci. Instrum. 72, 3848 (2001).
  53. L. Dinu, A. T. J. B. Eppink, F. Rosca-Pruna, H. L. Offerhaus, W. J. van der Zande, and M. J. J. Vrakking, Rev. Sci. Instrum. 73, 4206 (2002).
  54. V. Dribinski, A. Ossadtchi, V. A. Mandelshtam, and H. Reisler, Rev. Sci. Instrum. 73, 2634 (2002).
  55. D. Townsend, M. P. Minitti, and A. G. Suits, Rev. Sci. Instrum. 74, 2530 (2003).
  56. J. J. Lin, J. Zhou, W. Shiu, and K. Liu, Rev. Sci. Instrum. 74, 2495 (2003).
  57. H. Xu, Y. Guo, Q. Li, S. Liu, X. Ma, J. Liang, and H. Li, J. Chem. Phys. 119, 11609 (2003).
  58. L. Zhang, Z. Wang, J. Li, F. Wang, S. Liu, S. Yu, and X. Ma, J. Chem. Phys. 118, 9185 (2003).
  59. L. Zhang, F. Wang, Z. Wang, S. Yu, S. Liu, and X. Ma, J. Phys. Chem. A 108, 1342 (2004).

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