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Improving a high-resolution fiber-optic interferometer through deposition of a TiO2 reflective coating by simple dip-coating

Rev. Sci. Instrum. 80, 115104 (2009); doi:10.1063/1.3244088

Published 6 November 2009

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Venkatesh Subba-Rao, Chandran Sudakar, Jason Esmacher, Mircea Pantea, Ratna Naik, and Peter M. Hoffmann
Department of Physics and Astronomy, Wayne State University, Detroit, Michigan 48201, USA
Fiber-optic based interferometers are used to detect small displacements, down to the subnanometer range. Coating the end of the optical fiber with a partially reflecting thin film greatly improves the resolution of interferometers by increasing the multiple reflections between the fiber end and the measured object. In this work, we present a quick and easy thin film deposition technique to coat the end of a single optical fiber by dip-coating a metal-organic precursor, which is then decomposed in a propane flame. The coated fiber was tested for morphology and usefulness for interferometric application. We found that this coating technique is much faster and easier than conventional thin coating techniques, and yields results that are comparable or better than can be achieved with sputtering or thermal evaporation. ©2009 American Institute of Physics
History: Received 6 April 2009; accepted 14 September 2009; published 6 November 2009
Permalink: http://link.aip.org/link/?RSINAK/80/115104/1
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KEYWORDS and PACS

Keywords
PACS
  • 42.81.Bm
    Optical fiber fabrication, cladding, and splicing
  • 07.60.Ly
    Optical interferometers
  • 81.15.-z
    Methods of deposition of films and coatings
  • YEAR: 2009

PUBLICATION DATA

ISSN:
0034-6748 (print)   1089-7623 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (11)
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