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Electric and Mass Transport of a Suspended Multiwall Carbon Nanotube Studied by In situ Transmission Electron Microscopy

Source: Jpn. J. Appl. Phys. 49, 02BD07 (2010); doi:10.1143/JJAP.49.02BD07

Issue Date: 8 March 2010

PUBLICATION DATA
ISSN:
1553-9644 (online)
Publisher:
AIP is a member of CrossRef JSAP
Yasunobu Suzuki
Department of Quantum Engineering, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan

Koji Asaka
Department of Quantum Engineering, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan

Hitoshi Nakahara
Department of Quantum Engineering, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan

Yahachi Saito
Department of Quantum Engineering, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
A single multiwall carbon nanotube was bridged between platinum and indium–gallium (In–Ga) alloy electrodes in a transmission electron microscope, and electric resistances between the electrodes at various bridge lengths were measured in situ with the imaging of the structural dynamics of the nanotube. The intrinsic resistivity of the nanotube and the contact resistances between the nanotube and the electrodes were analyzed, and the resistivity of the nanotube was estimated to be $3.8 \times 10^{-4}$ $\Omega$ cm. At a high current exceeding about 120 µA with the In–Ga alloy electrode being positively biased, the alloy material migrated along the nanotube surface toward the counter electrode. ©2010

(As supplied by publisher.)

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