Home | About Journal | Web Links | E-mail Alerts | RSS RSS Icon | Browse
Previous Article Next Article

High current density, low threshold field emission from functionalized carbon nanotube bucky paper

Source: Appl. Phys. Lett. 97, 073102 (2010); doi:10.1063/1.3479049

Published 16 August 2010

EPAPS
KEYWORDS and PACS
Keywords
PACS
  • 79.70.+q
    Field emission, ionization, evaporation, and desorption
  • 73.61.Wp
    Electrical properties of fullerenes and related materials (thin films)
  • YEAR: 2010
RELATED DATABASES

To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.
PUBLICATION DATA
ISSN:
1553-9644 (online)
Publisher:
AIP is a member of CrossRef AIP
Bhalchandra A. Kakade,1 Vijayamohanan K. Pillai,2 Dattatray J. Late,3 Padmakar G. Chavan,3 Farid J. Sheini,3 Mahendra A. More,3 and Dilip S. Joag3
1Tokyo Institute of Technology, Chemical Resources Laboratory, R1-17, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan
2Physical and Materials Chemistry Division, National Chemical Laboratory, Pune 411-008, India
3Department of Physics, Center for Advanced Studies in Material Science and Condensed Matter of Physics, University of Pune, Pune 411007, India
Field emission studies of bucky paper of multiwalled carbon nanotubes (MWNTs), prepared after microwave (MW) assisted acid functionalization are reported along with a comparison with that of “as-grown” sample. MW treated bucky papers reveal an interesting linear field emission behavior in Fowler–Nordheim plot. The field emission currents at preset value are found to be remarkably stable over a period of more than 3 h sustaining current densities of 4.9  mA/cm2 and 8.5  mA/cm2 for “as-grown” and functionalized sample, respectively. The enhancement in the field emission due to functionalization has been discussed in terms of tip opening and defect induced charge transport caused by intershell and intertubular interaction. ©2010 American Institute of Physics
History: Received 7 May 2010; accepted 14 July 2010; published 16 August 2010
Permalink: http://link.aip.org/link/?APPLAB/97/073102/1

REFERENCES (28)

For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. M. Meyyappan, Carbon Nanotube Science and Application (CRC, Boca Raton, 2004).
  2. T. W. Ebbesen and P. M. Ajayan, Nature (London) 358, 220 (1992).
  3. C. N. R. Rao, R. Sen, B. C. Satishkumar, and A. Govindaraj, Chem. Commun. (Cambridge) 1998, 1525.
  4. V. K. Varadan and J. Xie, Smart Mater. Struct. 11, 610 (2002).
  5. X. Wang, Y. Liu, D. Zhu, L. Zhang, H. Ma, N. Yao, and B. Zhang, J. Phys. Chem. B 106, 2186 (2002).
  6. R. B. Sharma, D. J. Late, D. S. Joag, A. Govindaraj, and C. N. R. Rao, Chem. Phys. Lett. 428, 102 (2006).
  7. Y. Saito, R. Mizushima, and K. Hata, Surf. Sci. 499, L119 (2002).
  8. P. Rai, D. R. Mohapatra, K. S. Hazra, D. S. Misra, and S. P. Tiwari, Appl. Phys. Lett. 93, 131921 (2008).
  9. S. Fujii, S. Honda, H. Machida, H. Kawai, K. Ishida, M. Katayama, H. Furuta, T. Hirao, and K. Oura, Appl. Phys. Lett. 90, 153108 (2007).
  10. T. W. Weng, Y. H. Lai, and K. Y. Lee, Appl. Surf. Sci. 254, 7755 (2008).
  11. J. L. Killian, N. B. Zuckerman, D. L. Niemann, B. P. Ribaya, M. Rahman, R. Espinosa, M. Meyyappan, and C. V. Nguyen, J. Appl. Phys. 103, 064312 (2008).
  12. R. Seelaboyina, S. Boddepalli, K. Noh, M. Jeon, and W. Choi, Nanotechnology 19, 065605 (2008).
  13. J. M. Bonard, N. Weiss, H. Kind, T. Stockli, L. Forro, K. Kern, and A. Chatelain, Adv. Mater. (Weinheim, Ger.) 13, 184 (2001).
  14. K. S. Hazra, P. Rai, D. R. Mohapatra, N. Kulshrestha, R. Bajpai, S. Roy, and D. S. Misra, ACS Nano 3, 2617 (2009).
  15. R. Andrews, D Jacques, A. M. Rao, F. Derbyshire, D. Qian, X. Fan, E. C. Dickey, and J. Chen, Chem. Phys. Lett. 303, 467 (1999).
  16. B. A. Kakade, S. D. Patil, B. R. Sathe, S. P. Gokhale, and V. K. Pillai, J. Chem. Sci. 120, 599 (2008).
  17. E. H. Hong, K. -H. Lee, S. H. Oh, and C. G. Park, Adv. Funct. Mater. 13, 961 (2003).
  18. Y. Wang, Z. Iqbal, and S. Mitra, J. Am. Chem. Soc. 128, 95 (2006), and references therein.
  19. M. S. Raghuveer, S. Agraval, N. Bishop, and G. Ramanath, Chem. Mater. 18, 1390 (2006), and references therein.
  20. N. S. Ramgir, D. J. Late, A. B. Bhise, I. S. Mulla, M. A. More, D. S. Joag, and V. K. Pillai, Nanotechnology 17, 2730 (2006).
  21. M. Shiraishi and M. Ata, Carbon 39, 1913 (2001).
  22. R. H. Fowler and L. W. Nordheim, Proc. R. Soc. London, Ser. A 119, 173 (1928).
  23. J. M. Bonard, C. Klinke, K. A. Dean, and B. F. Coll, Phys. Rev. B 67, 115406 (2003).
  24. J. M. Bonard, J. P. Salvetat, T. Stockli, L. Forro, and A. Chitelain, Appl. Phys. A: Mater. Sci. Process. A69, 245 (1999).
  25. S. -C. Kung, K. C. Hwang, and I. Nan Lin, Appl. Phys. Lett. 80, 4819 (2002).
  26. S. Agrawal, M. S. Raghuveer, H. Li, and G. Ramanath, Appl. Phys. Lett. 90, 193104 (2007).
  27. S. Agrawal, M. S. Raghuveer, R. Ramprasad, and G. Ramanath, IEEE Trans. Nanotechnol. 6, 722 (2007).
  28. See supplementary material at http://dx.doi.org/10.1063/1.3479049 for HRTEM and Raman analysis of samples. [EPAPS]

CITING ARTICLES
For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.
ADVERTISEMENT